Method and apparatus for measuring surface reflectance of light-transmitting type antireflection optical function film and method of producing the film
AssigneeSony Corporation
InventorShinobu Mitsuhashi
Life of this patent
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Abstract
A method and apparatus for measuring a surface reflectance of an antireflection optical function film for use on a CRT display panel etc. accurately and in real time by the following formula: RI.sub.s =RI-(TI).sup.2 .times.[RI.sub.b /(1-RI.sub.b).sup.2 ] where, RI.sub.s is the surface reflectance of the light-transmitting type antireflection optical function film, RI is the actually measurable total reflectance, TI is the actually measurable transmittance, and RI.sub.b is the back reflectance calculated by a regression formula.
Claims15
A method of measuring a surface reflectance of a light-transmitting type antireflection optical function film comprising a step of calculating the surface reflectance of the optical function film from a back reflectance, total reflectance, and transmittance of the optical function film.
A method of producing a light-transmitting type antireflection optical function film including the steps of:
- sampling a representative film for a film continuously produced from an apparatus for continuously producing the optical function film and measuring in advance a back reflectance for the sampled film;
- measuring in real time a transmittance and total reflectance of the continuously produced film being measured;
- calculating in real time a surface reflectance of the optical function film using the transmittance and total reflectance and the previously calculated back reflectance;
- and
- feeding back the calculated surface reflectance to the production in the process of production of the optical function film to thereby produce a film having a desired surface reflectance.
An apparatus for measuring in real time a surface reflectance of a light-transmitting type antireflection optical function film being continuously produced from an apparatus for continuously producing the optical function film, comprising:
- a total reflectance calculation apparatus including a first light source means for emitting a first light having a first wavelength to the optical function film at a predetermined angle, a first light receiving means for detecting the light reflected from the surface and back of the optical function film, and a total reflectance calculating means for calculating a ratio of the first light and the detected reflected light to calculate the total reflectance;
- a transmittance calculation apparatus including a second light source means for emitting a second light having a second wavelength to the optical function film at a right angle, a second light receiving means for detecting the light passed through the optical function film, and a transmittance calculating means for calculating a ratio of the second light and the detected passing light to calculate the transmittance;
- a back reflectance calculating means for calculating in advance a back reflectance of a representative film;
- and
- a surface reflectance processing means for calculating for an optical function film being measured the surface reflectance of the optical function film from the total reflectance calculated at the total reflectance calculation apparatus, the transmittance calculated at the transmittance calculation apparatus, and the back reflectance calculated at the back reflectance calculating means.
Dependencies are inferred from the claim text.