Semiconductor apparatus having high withstand voltage
AssigneeDenso Corporation
InventorsAkihiko Teshigahara, Akiyoshi Asai, Kunihiro Onoda, Hiroyasu Itou, Ryuichirou Abe, Toshio Sakakibara
Life of this patent
Estimating the term…
Loading patent…
AssigneeDenso Corporation
InventorsAkihiko Teshigahara, Akiyoshi Asai, Kunihiro Onoda, Hiroyasu Itou, Ryuichirou Abe, Toshio Sakakibara
Estimating the term…
An island region surrounded by a trench is provided in an SOI substrate. The island region is further surrounded by a buffer region with a buffer region contact layer. In the island region, a source region is annularly provided around a drain region, and source and drain electrodes are respectively provided on the source and the drain regions. An annular auxiliary electrode is formed with the source electrode to extend over the trench. Accordingly, a voltage applied to the source electrode can be applied to the auxiliary electrode, so that electric field concentration between the buffer region and the source electrode is relaxed.
A semiconductor apparatus comprising:
A semiconductor apparatus comprising:
A semiconductor apparatus comprising:
Dependencies are inferred from the claim text.