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US 6,150,280 AGranted
Electron-beam cell projection aperture formation method
AssigneeNEC Corporation
InventorHiroshi Yamashita
Life of this patent
Estimating the term…
Abstract
The present invention provides an electron-beam cell projection aperture formation method comprising: a step of applying a converged ion beam to a top surface of a substrate so as to be etched to a depth enabling to obtain a sufficient film thickness for absorbing or scattering an electron-beam thereby to form an opening of a desired pattern on the top surface; and a step of uniformly applying the converged ion beam to a back surface of the substrate, excluding a hem portion thereof, so as to be etched to a depth reaching the opening.
Claims12
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam to a top surface of a substrate so as to be etched to a depth enabling to obtain a sufficient film thickness for absorbing or scattering an electron-beam thereby to form an opening of a desired pattern on said top surface;
- and
- a step of uniformly applying said converged ion beam to a back surface of said substrate, excluding a hem portion thereof, so as to be etched to a depth reaching said opening.
An electron-beam cell projection aperture formation method comprising:
- a step of uniformly applying a converged ion beam to, a back surface of a substrate, excluding a hem portion thereof, so as to be etched to a depth enabling to obtain a sufficient film thickness for absorbing or scattering an electron-beam, and
- a step of applying said converged ion beam to a top surface of said substrate whose back surface has been etched, thereby to form an opening of a desired pattern.
An electron-beam cell projection aperture formation method comprising:
- a step of uniformly applying a converged ion beam to a back surface of a substrate, excluding a hem portion thereof, so as to be etched to a depth enabling to obtain a sufficient film thickness for absorbing or scattering an electron-beam, and
- a step of further applying said converged ion beam to said back surface of said substrate which has been etched, thereby to form an opening of a desired pattern.
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam to a top surface of a substrate for etching an opening of a desired pattern having different etching depths at desired positions by etching a peripheral portion of said pattern to a depth enabling to obtain a first film thickness sufficient for absorbing or scattering an electron-beam and a center portion of said pattern to a depth enabling to obtain a second film thickness smaller than said first film thickness, and
- a step of applying said converged ion beam to a back surface of said substrate so as to be uniformly etched, excluding a hem portion thereof, to a depth reaching the deepest portion of said opening to form a through hole while the other portion of said opening has a thin film remaining.
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam to a back surface of a substrate so as to be uniformly etched, excluding a hem portion thereof, to a depth enabling to obtain a sufficient thickness for absorbing or scattering an electron-beam, and
- a step of applying said converged ion beam to a top surface of said substrate so as to perform etching while controlling the etching depth according to a position over said substrate thereby to obtain an opening of a desired pattern having different depths in such a manner that the deepest portion of said opening is a through hole and the other portion of said opening has a thin film as a bottom of said opening.
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam to a back surface of a substrate so as to be uniformly etched, excluding a hem portion of said substrate, to a depth enabling to obtain a sufficient thickness for absorbing or scattering an electron-beam, and
- a step of further applying said converged ion beam to said back surface of said substrate which has been etched, so as to perform etching while controlling the etching depth according to a position on said substrate thereby to obtain an opening of a desired pattern having different depths in such a manner that the deepest portion of said opening is a through hole and the other portion of said opening has a thin film as a bottom of said opening.
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam to a top surface of a substrate simultaneously with applying an etching gas to a position irradiated by said ion beam thereby to perform etching to a depth enabling to obtain a sufficient film thickness for absorbing or scattering an electron-beam and to form an opening of a desired pattern on said top surface of said substrate, and
- a step of applying said converged ion beam and said etching gas to a back surface of said substrate, excluding a hem portion of said substrate, thereby to perform a uniform etching to a depth reaching said opening.
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam to a back surface of a substrate simultaneously with applying an etching gas to a position irradiated by said ion beam thereby to perform a uniform etching, excluding a hem portion of said substrate, to a depth enabling to obtain a sufficient film thickness for absorbing or scattering an electron-beam, and
- a step of applying said converged ion beam to a top surface of said substrate whose back surface has been etched, simultaneously with application of an etching gas to a position irradiated by said converged ion beam, thereby to form an opening of a desired pattern.
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam to a back surface of a substrate simultaneously with application of an etching gas to a position irradiated by said ion beam thereby to perform a uniform etching, excluding a hem portion of said substrate, to a depth enabling to obtain a sufficient film thickness for absorbing or scattering an electron-beam, and
- a step of further applying said converged ion beam to said surface of said substrate which has been etched, simultaneously with application of an etching gas to a position irradiated by said converged ion beam, thereby to form an opening of a desired pattern.
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam simultaneously with application of an etching gas to a position irradiated by said converged ion beam, to a top surface of a substrate for etching an opening of a desired pattern having different etching depths at desired positions by etching a peripheral portion of said pattern to a depth enabling to obtain a first film thickness sufficient for absorbing or scattering an electron-beam and a center portion of said pattern to a depth enabling to obtain a second film thickness smaller than said first film thickness, and
- a step of applying said converged ion beam simultaneously with application of an etching gas to a position irradiated by said converged ion beam, to a back surface of said substrate having said opening formed, so as to uniformly etch said substrate, excluding a hem portion thereof, to a depth reaching the deepest portion of said opening to form a through hole while the other portion of said opening has a thin film remaining.
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam simultaneously with application of an etching gas to a position irradiated by said converged ion beam, to a back surface of a substrate for uniformly etching, excluding a hem portion of said substrate, to a depth enabling to obtain a sufficient thickness for absorbing or scattering an electron-beam, and
- a step of applying said converged ion beam simultaneously with application of an etching gas to a position irradiated by said converged ion beam, to a top surface of said substrate so as to perform etching while controlling the etching depth according to a position over said substrate thereby to obtain an opening of a desired pattern having different depths in such a manner that the deepest portion of said opening is a through hole and the other portion of said opening has a thin film as a bottom of said opening.
An electron-beam cell projection aperture formation method comprising:
- a step of applying a converged ion beam simultaneously with application of an etching gas to a position irradiated by said converged ion beam, to a back surface of a substrate for uniformly etching, excluding a hem portion thereof, to a depth enabling to obtain a sufficient thickness for absorbing or scattering an electron-beam, and
- a step of further applying said converged ion beam simultaneously with application of an etching gas to a position irradiated by said converged ion beam, to said back surface of said substrate which has been etched, so as to perform etching while controlling the etching depth according to a position on said substrate thereby to obtain an opening of a desired pattern having different depths in such a manner that the deepest portion of said opening is a through hole and the other portion of said opening has a thin film as a bottom of said opening.
Dependencies are inferred from the claim text.