Thin film piezoelectric device and ink jet recording head comprising the same
AssigneeSeiko Epson Corporation
InventorMasato Shimada
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AssigneeSeiko Epson Corporation
InventorMasato Shimada
Estimating the term…
The thin film piezoelectric device which has excellent properties is disclosed. A thin film piezoelectric device according to the present invention comprises a piezoelectric film which is polycrystalline, and two electrodes by which the piezoelectric film is sandwiched, wherein the size of crystal grains of the piezoelectric film substance is 0.4 .mu.m or more and equal to or less than the thickness of the piezoelectric film. A process for producing the thin film piezoelectric device are also disclosed. The process comprising the steps of: forming the precursor film of a piezoelectric film on an electrode, first heating the electrode at a temperature of 500 to 700.degree. C. to crystallize the precursor film, thereby obtaining a piezoelectric film which is polycrystalline, and secondly heating the electrode at a temperature of 750 to 1200.degree. C. in an oxygen-containing atmosphere, thereby controlling the size of crystal grains of the piezoelectric film, observable from the surface of the piezoelectric film to 0.4 .mu.m or more.
A process for producing a thin film piezoelectric device comprising (a) a piezoelectric film which is polycrystalline and (b) two electrodes by which the piezoelectric film is sandwiched, wherein the size of crystal grains of the piezoelectric film is 0.4 .mu.m-3 .mu.m and is equal to or less than the thickness of the piezoelectric film, and wherein the piezoelectric film has a thickness of 1 .mu.m-5 .mu.m, said method comprising the steps of
Dependencies are inferred from the claim text.