Loading patent…
AssigneeBASF SE
InventorsDieter Volkmer, Peter Schey, Herbert Plotz, Franz Langhauser, Dirk Meckelnburg, Hans-Josef Klein, Michael Bergner, Jurgen Oelze
Estimating the term…
A process and apparatus for the measurement of parameters in reactors having moving stirrers which contain probes in the reactor interior, wherein at least two probes connected via a multiplexer to a sensor signal amplifier by connecting cables located in the moving stirrers are installed on the surface of the moving stirrers, and the measurement data obtained by the probes are passed via the connecting cables to a sensor signal amplifier and from thence are passed on to an electronic evaluation unit by non-contact, inductive signal transmission by means of a contactless sensor tap.
A process for the measurement of parameters in reactors having moving stirrers which contain probes in the reactor interior, wherein at least two probes connected to a sensor signal amplifier by connecting cables located in the moving stirrers are installed on the surface of the moving stirrers, and the measurement data obtained by the probes are passed via the connecting cables to a sensor signal amplifier and from thence are passed on to an electronic evaluation unit by non-contact, inductive signal transmission by means of a contactless sensor tap.
A device for determining parameters in reactors having moving stirrers which contain probes in the reactor interior, at least two probes connected to a sensor signal amplifier by connecting cables located in the moving stirrer being installed on the surface of the moving stirrer, the amplifier being in turn connected to an electronic evaluation unit via a contactless sensor tap.
Dependencies are inferred from the claim text.