Method and system for generating product performance history

A method used in the manufacturing of a semiconductor device, comprising the steps of:

• (a) collecting process data having a first prescribed format representing processing of a semiconductor material to form a semiconductor circuit, and collecting test data of a second prescribed format representing testing of the semiconductor circuit;
• (b) reformatting said process data and said test data into a predetermined data format comprising at least one of the first prescribed format, the second prescribed format and another prescribed format to produce reformatted data;
• and
• (c) loading said reformatted data into at least one database server to produce a database containing said reformatted data in the predetermined format.

A method used in the manufacturing of a semiconductor device, comprising the steps of:

• (a) collecting process data of a prescribed format representing processing of a semiconductor material to form a semiconductor circuit, and collecting test data of the prescribed format representing testing of the semiconductor circuit;
• (b) reformatting said process data and said test data into a predetermined data format to produce reformatted data;
• and
• (c) loading said reformatted data into at least one database server to produce a database containing said reformatted data in the predetermined format.

A method used in the manufacturing of a semiconductor device, comprising the steps of:

• (a) collecting process data of a first prescribed format representing processing of a semiconductor material to form a semiconductor circuit, and collecting test data of a second prescribed format representing testing of the semiconductor circuit;
• (b) reformatting said process data and said test data into a predetermined data format to produce reformatted data;
• and
• (c) loading said reformatted data into at least one database server to produce a database containing said reformatted data in the predetermined format.

A system for use in the manufacturing of a semiconductor device, comprising:

• means for collecting process data having a prescribed format representing the processing a semiconductor material to form a semiconductor circuit, and for collecting test data of the prescribed format representing the testing of the semiconductor circuit;
• means for reformatting said process data and said test data into a predetermined data format to produce reformatted data;
• and
• means for loading said reformatted data into at least one database server to produce a database containing said reformatted data in the predetermined format.

A system for use in the manufacturing of a semiconductor device, comprising:

• means for collecting process data having a first prescribed format representing processing of a semiconductor material to form a semiconductor circuit, and for collecting test data having a second prescribed format representing testing of the semiconductor circuit;
• means for reformatting said process data and said test data into a reformatted data format to produce reformatted data;
• and
• means for loading said reformatted data into at least one database server to produce a database containing said data in the reformatted format.