Projection measuring instrument
AssigneeMitutoyo Corporation
InventorsKenji Okabe, Hiroshi Watabe, Taizo Nakamura
Life of this patent
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AssigneeMitutoyo Corporation
InventorsKenji Okabe, Hiroshi Watabe, Taizo Nakamura
Estimating the term…
A projection measuring instrument requiring no exchange work of overlay chart for comparatively observing a workpiece image and a template is provided. For the object, a table (56) for a workpiece (55) to be put on, an observation optical system having a screen (1) and a projection lens (53) for projecting an image of the workpiece (55) onto the screen (1), a relative movement unit (57) for relatively moving the table (56) and the observation optical system, and a displacement sensor (61) for detecting relative movement displacement by the relative movement unit (57) are provided, the screen (1) being a liquid crystal display, the liquid crystal display having a display controller (2) for displaying a line drawing for measuring a profile of the workpiece (55) onto the liquid crystal display at a predetermined magnification.
A projection measuring instrument, comprising:
A projection measuring instrument, comprising:
Dependencies are inferred from the claim text.