Ion source and mass spectrometer instrument using the same
AssigneeHitachi, Ltd.
InventorsAtsumu Hirabayashi, Minoru Sakairi, Yasuaki Takada, Hideaki Koizumi, Kaoru Umemura
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AssigneeHitachi, Ltd.
InventorsAtsumu Hirabayashi, Minoru Sakairi, Yasuaki Takada, Hideaki Koizumi, Kaoru Umemura
Estimating the term…
A mass spectrometer includes a sample passage through which a sample solution flows towards a tip of the sample passage, a gas passage which produces a gas flow along the sample passage towards an orifice of the gas passage, a gas supplier which supplies a gas to the gas passage so that the gas flow has a velocity effective for spraying the sample solution near the tip of the sample passage, and an analyzer which analyzes a mass of gaseous ions formed from the sample solution sprayed by the gas flow. The gas flow has a characteristic value F/S between 350 meters/second (m/s) and 700 m/s, where F is a flow rate of the gas at standard conditions (20.degree. C., 1 atmosphere), and S is a difference between a cross section of the orifice and a cross section of the sample passage at the orifice. An exposed length of the sample passage between an external opening of the orifice and the tip of the sample passage may be between -0.25 mm and 1.2 mm.
A mass spectrometer comprising:
A mass spectrometer comprising:
A mass spectrometer comprising:
A mass spectrometer comprising:
An ion source apparatus comprising:
An ion source apparatus comprising:
A mass spectrometer comprising:
A mass spectrometer comprising:
An ion source apparatus, comprising:
A method of generating ions, comprising the steps of:
A method of generating ions, comprising the steps of:
An ion source apparatus comprising:
An ion source apparatus comprising:
An ion source apparatus comprising:
A mass spectrometer comprising:
A mass spectrometer comprising:
A mass spectrometer comprising:
Dependencies are inferred from the claim text.