Apparatus having a multiple angle transparent rotating element for measuring the thickness of transparent objects
AssigneeHaag-Streit AG
InventorsPhilippe Chavanne, Rene Paul Salathe
Life of this patent
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AssigneeHaag-Streit AG
InventorsPhilippe Chavanne, Rene Paul Salathe
Estimating the term…
The apparatus for measuring the thickness of transparent objects (1) has a radiation source (3) of short coherence length and a Michelson interferometer (5), wherein the object (1) to be measured can be arranged in its measuring arm (11), and path length variation element (15), which has an optical path length that changes periodically due to its own rotation, is arranged in the reference arm (13). The cross-sectional surface (34) of the element (15) wherein the reference beam comes to rest has at least four corners so that the reference radiation path in the element (15) has at least two reflections on the inner surfaces of the element. The reference beam (41e) coming out of the element (15) is reflected back by means of a fixed reflector (30) into the element (15), preferably into itself. The measurements of the side surfaces of the element (15), the beam entry location therein, as well as the index of refraction of the element material can be selected in such a way that the path length difference obtained by means of the rotating element (15) runs approximately linearly to the rotation angle in a preferred embodiment. This linearity results in a reduced bandwidth of the Doppler frequency of the radiation irradiating on the object (1). This reduced bandwidth of the Doppler frequency allows an excellent filtration and results thereby in a reduced signal-noise ratio of the measuring signal.
An apparatus configured as a Michelson interferometer for measuring thickness of a transparent object, comprising:
An apparatus configured as a Michelson interferometer for measuring thickness of a transparent object, comprising:
An apparatus configured as a Michelson interferometer for measuring thickness of a transparent object, comprising:
Dependencies are inferred from the claim text.