Method and apparatus for inspecting foreign substance
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsTatsuo Nagasaki, Ken Shimono
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AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsTatsuo Nagasaki, Ken Shimono
Estimating the term…
An inspecting method for inspecting foreign substances, comprising projecting beams from an illumination system arranged above a light-permeable body to be inspected with an angle of incidence of a first elevation angle onto an upper face of the body, and receiving a reflecting light and a scattering light generated by the beams with a photodetecting angle of a second elevation angle by a photodetecting system. The method further comprising, before the beams are projected, setting a width of the beams of the illumination system to be not larger than w calculated according to an expression w<2* sin .alpha.*t{tan[sin.sup.-1 {sin(90.degree.-.alpha.)/n}]-tan[sin.sup.-1 {sin(.theta.-90.degree.)/n}]} from the angle of incidence .alpha., the photodetecting angle .theta., a thickness t of the body and a refractive index n of the body to a substance over the body.
An inspecting method for inspecting particles, which comprises:
An inspecting apparatus for inspecting particle, which comprises:
Dependencies are inferred from the claim text.