Back to results
US 6,144,048 AGranted
Heterojunction field effect transistor and method of fabricating the same
AssigneeNippon Telegraph and Telephone Corporation
InventorsTetsuya Suemitsu, Takatomo Enoki
Life of this patent
Estimating the term…
Abstract
A Schottky barrier layer in separate regions between a source electrode and a gate electrode and between a drain electrode and the gate electrode is completely covered with an etching stopper layer. The gate electrode is separated from a cap layer.
Claims6
A heterojunction field effect transistor comprising:
- a buffer layer arranged on a semiconductor substrate;
- a channel layer arranged on the buffer layer;
- a spacer layer arranged on the channel layer;
- a carrier supply layer arranged on the spacer layer;
- a Schottky barrier layer arranged on the carrier supply layer;
- an etching stopper layer arranged on the Schottky barrier layer;
- a cap layer arranged on the etching stopper layer and containing a high concentration dopant;
- a source electrode and drain electrode arranged apart from each other on the cap layer;
- a recess formed in a region of the cap layer sandwiched between the source and drain electrodes so as to extend from the cap layer to the Schottky barrier layer via the etching stopper layer;
- the Schottky barrier layer is covered with the etching stopper layer to both sides of the gate electrode;
- and
- the gate electrode is separated from the cap layer, the gate electrode being ledge-shaped such that the gate electrode is partly formed on a surface of said Schottky barrier layer exposed in the recess, and partly formed on the stopper layer exposed in the recess.
9 more elements
Dependencies are inferred from the claim text.