Apparatus and method for generating plasma
AssigneeApplied Materials, Inc.
InventorsSteven T. Li, Andrew J. Ruspini, Henry Ho, Yu Chang, Aihua Chen, Binh Bui
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AssigneeApplied Materials, Inc.
InventorsSteven T. Li, Andrew J. Ruspini, Henry Ho, Yu Chang, Aihua Chen, Binh Bui
Estimating the term…
An apparatus comprising a semiconductor processing chamber, a plasma generator, and a pipe connecting a semiconductor processing chamber and the plasma generator. The plasma generator includes a generation chamber, a radio frequency generator which generates an ion plasma within the generation chamber, and a magnetic device which confines the plasma primarily within a center region of the generation chamber.
An apparatus comprising:
An apparatus comprising:
An apparatus comprising:
A method of cleaning a semiconductor processing chamber, comprising the steps of:
A method of cleaning a semiconductor processing chamber, comprising the steps of:
A method of generating a plasma, comprising the steps of:
Dependencies are inferred from the claim text.
1). Field of the Invention
The present invention relates generally to cleaning of semiconductor processing chambers and auxiliary equipment such as interconnecting pipes and, more specifically, to an apparatus and a method wherein an ion plasma is generated externally of a semiconductor processing chamber and the ion plasma is then introduced into the semiconductor processing for cleaning purposes.
2). Discussion of Related Art
The invention is further described by way of example with reference to the accompanying drawings wherein:
FIG. 1 is a partially sectioned side view illustrating a system according to the invention;
FIG. 2 is a partially sectioned perspective view of a plasma generator for use in the system of FIG. 1;
In the following description, for purposes of explanation, numerous details are set forth in order to provide a thorough understanding of the present invention. However, it will be apparent to one skilled in the art that these specific details are not required in order to practice the present invention. Certain specifics regarding apparatus, materials, dimensions, process parameters and results are recited. These and other specifics are recited in order to provide an example of a workable embodiment of the invention, and may be altered according to preference or requirement without departing from the broader scope of the invention.
The following description relates to an apparatus and a method of cleaning a semiconductor processing chamber. A gas is introduced into a plasma generation chamber and vibrated at radio frequency. Vibration of the gas causes disassociation of the gas into reactive ions. The ions then flow out of the generation chamber through a pipe and into a semiconductor processing chamber. The gas is then allowed to clean the semiconductor processing chamber by reacting with contaminants therein.
FIG. 1 of the accompanying drawings illustrates a system 110 according to one embodiment of the present invention. The system 110 includes a plasma generator 112, a semiconductor processing chamber 114, a pipe 116 connecting the plasma generator 112 and the semiconductor processing chamber 114 with a shower head portion 118 of the pipe 116 extending into the semiconductor processing chamber 114, and a pump 120 with a low pressure side 122 connected to the semiconductor process chamber 114.
No related US applications are recorded in the indexed filing history.
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Hygiene: in situ cleaning of vessels and/or internal parts
Radio frequency generated discharge: the radio frequency energy being inductively coupled to the plasma
Characterised by the type of processing: cleaning
Electric discharge tubes or discharge lamps
Term ended 19 Mar 2018 (estimated)
USPTO file history isn’t available for this patent, so only indexed dates are shown.