Ion-trap mass analyzing apparatus and ion trap mass analyzing method
AssigneeHitachi, Ltd.
InventorsKiyomi Yoshinari, Yoichi Ose, Yoshiaki Kato, Katsuhiro Nakagawa
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AssigneeHitachi, Ltd.
InventorsKiyomi Yoshinari, Yoichi Ose, Yoshiaki Kato, Katsuhiro Nakagawa
Estimating the term…
An numerical analysis time which is assigned to mass select one ion species having a specific mass-to-charge ratio mass selected is divided into the first part time and the second part time, and a dipole auxiliary electric field capable of spatially reducing a spread is superimposed in the first part time of the numerical analysis time and a quadrupole auxiliary voltage capable of rapidly emitting ions when position coordinates are large is superimposed in the second part of the time. Therefore, the initial spatial spread is reduced in the first part time and the trajectories of ions is rapidly amplified in the second part time, and the ions are emitted. Thus, the entire mass sweep time can be reduced and a high-resolution numerical analysis can be accelerated.
An ion-trap mass analyzing apparatus having a trap space which is enclosed by electrodes and in which ions are captured, and a controller for controlling an AC voltage to be applied to the electrode so as to form a first electric field and a second electric field for increasing the amplitude of oscillation of the captured ions;
An ion-trap mass analyzing apparatus having a trap space which is enclosed by electrodes and in which ions are captured and a controller for controlling an AC voltage to be applied to the electrode so as to form a dipole auxiliary electric field and a quadrupole auxiliary electric field, wherein the controller controls the AC voltage so as to form the quadrupole auxiliary electric field after forming the dipole auxiliary electric field.
An ion-trap mass analyzing apparatus having an annular ring electrode and two end cap electrodes facing each other so as to sandwich the ring electrode, wherein RF electric field is formed to trap ions between electrodes by applying RF voltage between the ring and the end-cap electrodes by power supply, and two types of auxiliary AC electric fields are also formed between electrodes;
An ion-trap mass analyzing apparatus having an annular ring electrode and two end cap electrodes facing each other so as to sandwich the ring electrode, wherein at least a high-frequency voltage of a DC voltage and the high-frequency voltage to select an ion species having a mass-to-charge ratio to be detected out of ions stably captured in a quadrupole electric field formed in an inter-electrode space by applying at least high-frequency voltage of a DC voltage and the high-frequency voltage between the ring electrode and the end cap electrodes from a main power supply by generating an auxiliary AC electric field weaker than the quadrupole electric field and thereby, amplifying the trajectories of the ions to be mass selected detected and emitting the ion from the inter-electrode space;
An ion-trap mass analyzing method comprising the steps of applying an AC voltage to an electrode to capture ions in a trap space and forming first and second auxiliary electric fields for supplying energy to the captured ions to increase the amplitude of their oscillation, wherein the first auxiliary electric field has less influence of the amplitude of an ion on the position of it than the second auxiliary electric field and the second electric field is formed after the first electric field is formed.
An ion-trap mass analyzing method comprising the steps of forming an ion-trap space by two end cap electrodes facing each other so as to sandwich an annular ring electrode, forming a dipole auxiliary AC electric field by applying AC voltages shifted from each other by half phase between the two end cap electrodes, controlling the spatial dispersion between ions having the same mass-to-charge ratio, and forming the dipole auxiliary AC electric field and thereafter forming a quadrupole auxiliary AC electric field.
An ion-trap mass analyzing method comprising the steps of applying an AC voltage to an electrode to capture ions in a trap space and forming first and second auxiliary electric fields for increasing the amplitude of the captured ions, wherein the first auxiliary electric field has less influence of the amplitude of an ion on the position of it than the second auxiliary electric field and the second auxiliary electric field is formed after the first auxiliary electric field is formed.
An ion-trap mass analyzing method comprising the steps of applying an AC voltage to an electrode to capture ions in a trap space and forming first and second auxiliary electric fields for increasing the amplitude of the captured ions, wherein the first auxiliary electric field has smaller spatial spread than the second auxiliary electric field and the second auxiliary electric field is formed after the first auxiliary electric field is formed.
Dependencies are inferred from the claim text.