Microbump interconnect for semiconductor dice
AssigneeMicron Technology, Inc.
InventorSalman Akram
Life of this patent
Estimating the term…
Abstract
A method for forming an interconnect for making a temporary or permanent electrical connection to a semiconductor dice is provided. The interconnect includes a rigid substrate on which an insulating layer and a pattern of conductors are formed. A compliant layer is formed on the insulating layer of a material such as polyimide. Vias are formed in the compliant layer with metal contacts in electrical communication with the conductors. Microbumps are formed on the compliant layer in electrical communication with the contacts and are adapted to flex with the compliant layer. The interconnect can be used to provide a temporary electrical connection for testing bare semiconductor dice. Alternately the interconnect can be used for flip chip mounting dice for fabricating multi chip modules and other electronic devices.
Claims23
An interconnect configured for use in a test apparatus for testing a semiconductor die having a plurality of contacts in a first pattern comprising:
- a substrate comprising an electrically insulating first layer;
- a plurality of conductors on the first layer;
- an electrically insulating second layer on the conductors comprising a compliant polymeric material;
- a plurality of vias through the second layer to the conductors having a second pattern matching the first pattern;
- and
- a plurality of microbumps on the second layer aligned with the vias and in electrical communication with the conductors, the microbumps substantially larger than the vias such that the microbumps are supported by the second layer and can flex with the second layer to make temporary electrical connections with the contacts on the die upon application of a force by the test apparatus.
A multi chip module comprising:
- a substrate comprising an electrically insulating first layer;
- a plurality of conductors on the first layer;
- an electrically insulating second layer on the conductors comprising a compliant polymeric material;
- a plurality of vias through the second layer to the conductors having a first diameter and a first pattern;
- a plurality of microbumps in the vias in electrical communication with the conductors, the microbumps having a second diameter substantially larger than the first diameter such that the microbumps are supported by the second layer and can flex with the second layer upon application of an external force;
- and
- at least one semiconductor die flip chip mounted to the substrate comprising a plurality of contacts in a second pattern matching the first pattern and bonded to the microbumps.
An interconnect configured for use in a test apparatus for testing a semiconductor die having a plurality of contacts in a first pattern comprising:
- a substrate;
- a plurality of conductors on the substrate;
- an electrically insulating layer on the conductors comprising a compliant polymeric material;
- a plurality of vias through the layer to the conductors having a second pattern matching the first pattern;
- and
- a plurality of microbumps supported by the layer and aligned with the vias in electrical communication with the conductors, the microbumps configured to make temporary electrical connections with the contacts on the die, and to flex with the layer during application of an external force by the test apparatus to accommodate dimensional variations in the contacts or the microbumps.
An interconnect configured for use in a test apparatus for testing a semiconductor die having a plurality of contacts in a first pattern comprising:
- a substrate;
- a plurality of conductors on the substrate;
- an electrically insulating compliant layer on the conductors comprising a polymeric material;
- a plurality of vias through the compliant layer to the conductors, the vias having a first diameter and a second pattern matching the first pattern;
- and
- a plurality of microbumps on the compliant layer configured to make temporary electrical connections with the contacts on the die, the microbumps aligned with the vias in electrical communication with the conductors, the microbumps having a second diameter substantially larger than the first diameter such that the microbumps can flex with the compliant layer during application of an external force by the test apparatus to accommodate dimensional variations in the contacts or the microbumps during making of the temporary electrical connections.
A multi chip module comprising:
- a substrate;
- at least one semiconductor die flip chip mounted to the substrate comprising a plurality of contacts in a first pattern;
- a plurality of conductors on the substrate;
- an electrically insulating compliant layer on the conductors comprising a polymeric material;
- a plurality of vias through the compliant layer to the conductors having a second pattern matching the first pattern;
- a plurality of microbumps supported by the compliant layer and aligned with the vias in electrical communication with the conductors, the microbumps bonded to the contacts on the die, and configured to flex with the compliant layer upon application of an external force to accommodate dimensional variations in the contacts or the microbumps.
Dependencies are inferred from the claim text.