Method of making a large area imager with improved signal-to-noise ratio
AssigneeOIS Optical Imaging Systems, Inc.
InventorsWillem den Boer, John Z. Z. Zhong, Tieer Gu, Young H. Byun, Steven Aggas
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AssigneeOIS Optical Imaging Systems, Inc.
InventorsWillem den Boer, John Z. Z. Zhong, Tieer Gu, Young H. Byun, Steven Aggas
Estimating the term…
This invention is related to a radiation imager (e.g. x-ray imager) and method of making same. An insulating material having a low dielectric constant is provided in areas of overlap between collector electrodes and underlying TFTs, diodes, and/or address lines in order to improve the signal-to-noise ratio of the imager. The TFT array and corresponding imager are made in certain embodiments by coating the address lines and TFTs with a photo-imageable insulating layer which acts as a negative resist, exposing portions of the insulating layer with UV light, removing non-exposed areas of the insulating layer so as to form contact vias, and depositing storage capacitor collecting electrodes over the insulating layer so that the collecting electrodes contact TFT source electrodes through the contact vias. The resulting imager has an improved signal-to-noise ratio due to the low dielectric constant of the insulating layer.
A method of making an x-ray imaging device including an array of semiconductor switching elements, the method comprising the steps of:
Dependencies are inferred from the claim text.