Probe tip structure
OwnerGregory George Boll, Harry Joseph Bollinventors
Life of this patent
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Abstract
A probe tip structure is disclosed which is obtained from a solid piece of material having a bore machined therein which extends from a first end where the probe tip is attached to a coaxial transmission line to a second end where contact points are machined therein. The inner conductor of the transmission line extends into the bore to the second end of the probe tip where another contact point is formed. All contact points are adapted to contact a device under test. A rigid insulating structure is placed within the bore of the probe tip to hold the inner conductor securely in a fixed position.
Claims19
A Probe tip structure for connection to an end of a coaxial transmission line having an inner electrical conductor surrounded by an outer electrically conducting shield, said probe tip structure consisting of a solid piece of electrically conducting material having a bore therein at one end thereof, said bore is symmetrical about its axis, and further having at least one electrically contacting member at another end thereof and machined therefrom, said contacting member itself having an end adapted for making contact to a circuit to be tested, said bore extending farther into said probe tip with a smaller size which is also symmetrical about its axis adapted to receive said inner conductor therein said inner conductor also having an end adapted for making contact to said circuit to be tested, a spacing between said contacting member and said inner conductor is chosen to control the impedance of said probe tip structure.
A probe tip structure for connection to a coaxial transmission line having an inner conductor and a shield for testing electronic circuits, said probe tip structure formed from a solid piece of electrically conducting material having first and second ends and further having a bore therein, said bore is symmetrical about its axis, and extends from said first end to said second end where at least two contacting members are located having ends adapted for contacting the circuit to be tested, a first of said two members being adapted for connection to said inner conductor of said coaxial transmission line and a second of said two contacting members being adapted for connection to said shield of said coaxial transmission line.
A probe tip structure for connection to a coaxial transmission line having an inner conductor and a shield for testing electronic circuits, said probe tip structure consisting of a rod of a solid piece of material having first and second ends and further having a bore therein at said first end and further having at said second end a web machined in said solid piece of material, said web further having a space machined therein resulting in at least two spaced apart contact points.
Dependencies are inferred from the claim text.