# US 6,097,355 A · Purity/beam landing error measurement method for electronic display devices > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 6,097,355 A - Document ID: US6097355A - Status: Granted - Kind: A - Application number: 08/971,947 - Filed: 1997-11-17 - Granted: 2000-08-01 - Earliest claimed: 1997-11-17 - Assignees: Image Processing Systems, Inc. - Inventors: Wayne G. Dawe; Karoly G. Nemeth - Web page: https://patentgrep.com/patent/US6097355A ## CPC - H04N 17/04: for receivers - H01J 9/42: Measurement or testing during manufacture - H04N: PICTORIAL COMMUNICATION, e.g. TELEVISION - H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H) ## Abstract A method of calculating beam landing errors in an electronic display device having color phosphor elements and electron guns to generate electron beams to impinge on corresponding phosphor elements require a magnetic field to be generated to deflect an electron beam relative to the corresponding phosphor element on which the electron beam is to impinge. The intensity of light emitted by the phosphor elements in the measurement area is measured as the electron beam impinges thereon. The polarity of the magnetic field is reversed and the above step is repeated. Thereafter, the magnitude of the magnetic field is changed and the above two steps are repeated thereby to measure at least two different light intensities resulting from electron beam influenced by each polarity magnetic field. The at least two different light intensities resulting from electron beams influenced by each polarity magnetic field are then approximated with straight lines and an intersection point of the straight lines is determined. A corresponding magnetic field to the intersection point is also determined. A magnetic field is then generated corresponding to the intersection point and the intensity of light emitted by the phosphor element as the electron beam impinges thereon is measured. A beam landing error is then calculated using a characteristic of the phosphor element and at least some of the measured light intensities and corresponding generated magnetic fields. ## Claims ### Claim 1 A method of calculating beam landing errors in an electronic display device having color phosphor elements, and electron guns to generate electron beams to impinge on corresponding phosphor elements, said method comprising the steps of: (i) generating a magnetic field having a first magnitude to deflect an electron beam relative to the corresponding phosphor element on which said electron beam is to impinge and measuring the intensity of light emitted by said phosphor element as said electron beam impinges thereon; (ii) reversing the polarity of said magnetic field and repeating step (i) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said first magnitude; (iii) changing the magnitude of the magnetic field to a second magnitude and repeating steps (i) and (ii) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said second magnitude; (iv) approximating the at least two different light intensities influenced by the magnetic fields of said first magnitude with a first straight line and approximating the at least two different light intensities influenced by the magnetic fields of said second magnitude with a second straight line and determining an intersection point of said first straight line and said second straight line; (v) generating a magnetic field having a magnitude corresponding to said intersection point and measuring the intensity of light emitted by said phosphor element as said electron beam impinges thereon; and (vi) calculating a beam landing error using a characteristic of said phosphor element and at least some of said measured light intensities and corresponding magnetic field magnitudes. ### Claim 2 (depends on 1) The method of claim 1 wherein said characteristic is a dimension of said phosphor element. ### Claim 3 (depends on 2) The method of claim 2 wherein said beam landing error is calculated using the formula: ##EQU3## where: dI1' and dI2' are differences between normalized light intensities measured at step (i); dW1 and dW2 are differences between the magnitudes of the magnetic fields corresponding to the light intensities measured at step (i); W6 is the magnetic field corresponding to the intersection point of said first straight line and said second straight line; and PW is the dimension of said phosphor element in the direction of deflection of said electron beam. ### Claim 4 (depends on 1) The method of claim 1 wherein at step (iii) the magnitude of said magnetic field is decreased. ### Claim 5 (depends on 3) The method of claim 3 wherein steps (i) to (iii) are performed three or more times. ### Claim 6 (depends on 5) The method of claim 5 wherein said light intensities are approximated using a higher order function and wherein said first straight line and said second straight line are determined from said high order function. ### Claim 7 (depends on 6) The method of claim 6 wherein said higher order function is a hyperbola and wherein said first straight line and said second straight line are determined by the asymptote thereof. ### Claim 8 (depends on 1) The method of claim 1 wherein said straight lines are determined using a straight line approximation. ### Claim 9 A method of calculating beam landing errors in a color picture tube having a phosphor screen including a plurality of spaced, red, green and blue phosphor stripes, electron guns to generate red, green and blue electron beams to impinge on corresponding phosphor stripes and a shadow mask interposed between said electron guns and said phosphor screen, said method comprising the steps of: (i) generating a magnetic field having a first magnitude to deflect an electron beam relative to the corresponding phosphor stripe on which said electron beam is to impinge and measuring the intensity of light emitted by said phosphor stripe as said electron beam impinges thereon; (ii) reversing the polarity of said magnetic field and repeating step (i) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said first magnitude; (iii) changing the magnitude of the magnetic field to a second magnitude and repeating steps (i) and (ii) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said second magnitude; (iv) approximating each of said at least two different light intensities influenced by the magnetic fields of said first magnitude with a first straight line and approximating the at least two different light intensities influenced by the magnetic fields of said second magnitude with a second straight line and determining an intersection point of said first straight line and said second straight line; (v) generating a magnetic field having a magnitude corresponding to said intersection point and measuring the intensity of light emitted by said phosphor stripe as said electron beam impinges thereon; and (vi) calculating a beam landing error using the width of said phosphor stripe and at least some of said measured light intensities and corresponding magnetic field magnitudes. ### Claim 10 (depends on 9) The method of claim 9 wherein said beam landing error is calculated using the formula: ##EQU4## where: dI1' and dI2' are differences between normalized light intensities measured at step (i); dW1 and dW2 are differences between the magnetic fields corresponding to the light intensities measured at step (i); W6 is the magnetic field corresponding to the intersection point of said first straight line and said second straight line; and PW is the width of said phosphor stripe. ### Claim 11 (depends on 9) The method of claim 9 wherein steps (i) to (iii) are performed three or more times. ### Claim 12 (depends on 11) The method of claim 11 wherein said light intensities are approximated using a higher order function and wherein said first straight line and said second straight line are determined from said high order function. ### Claim 13 (depends on 12) The method of claim 12 wherein said higher order function is a hyperbola and wherein said first straight line and said straight line are determined by the asymptote thereof. ### Claim 14 (depends on 9) The method of claim 9 wherein said straight lines are determined using a straight line approximation. ### Claim 15 A method of calculating beam landing errors in a color display tube having a phosphor screen including a matrix of red, green and blue phosphor dots, electron guns to generate red, green and blue electron beams to impinge on corresponding phosphor dots, said method comprising the steps of: (i) generating a magnetic field having a first magnitude to deflect the electron beam relative to the corresponding phosphor dot on which said electron beam is to impinge in one of a horizontal and vertical direction and measuring the intensity of the light emitted by said phosphor dot as said electron beam impinges thereon; (ii) reversing the polarity of said magnetic field and repeating step (i) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said first magnitude; (iii) changing the magnitude of the magnetic field to a second magnitude and repeating steps (i) and (ii) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said second magnitude; (iv) approximating the at least two different light intensities by the magnetic fields of said first magnitude with a first straight line and approximating the at least two different light intensities influenced by the magnetic fields of said second magnitude with a second straight line and determining an intersection point of said first straight line and said second straight line and a magnetic field magnitude corresponding to said intersection point; (v) maintaining the magnetic field magnitude determined at step (iv) and repeating steps (i) to (iv) with said electron beam being deflected in the other of the horizontal and vertical direction; (vi) generating said magnetic field corresponding to said intersection point with said magnetic field being maintained and measuring the intensity of light emitted by said phosphor dot as said electron beam impinges thereon; (vii) calculating a beam landing error for said other of the horizontal and vertical direction using a dimension of said phosphor dot and at least some of said measured light intensities and corresponding magnetic field magnitudes; and (viii) repeating steps (v) to (vii) with the magnetic field being maintained as determined at step (v) thereby to calculate the beam landing error for said one of the horizontal and vertical direction. ### Claim 16 (depends on 15) The method of claim 15 wherein said measured light intensities are linearized using values taken from a look-up table to linearize the common area of intersecting circles. ### Claim 17 A method of calculating beam landing errors in an electronic display device having color phosphor elements, and electron guns to generate electron beams to impinge on corresponding phosphor elements, said method comprising the steps of: (i) generating a magnetic field having a first magnitude to deflect an electron beam relative to the corresponding phosphor element on which said electron beam is to impinge and measuring the intensity of light emitted by said phosphor element as said electron beam impinges thereon; (ii) reversing the polarity of said magnetic field and repeating step (i) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said first magnitude; (iii) generating a magnetic field having a second magnitude different from said first magnitude to deflect an electron beam relative to the corresponding phosphor element on which said electron beam is to impinge and measuring the intensity of light emitted by said phosphor element as said electron beam impinges thereon; (iv) reversing the polarity of said magnetic field and repeating steps (iii) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said second magnitude; (v) calculating a first straight line approximating the light intensities measured at step (i) and a second straight line approximating the light intensities measured at step (iii), said first straight line and second straight line intersecting one another; (v) determining an intersection point of said first straight line and said second straight line and a magnetic field magnitude corresponding to the intersection point; (vii) generating a magnetic field having a magnitude corresponding to the intersection point and measuring the intensity of light emitted by said phosphor element as said electron beam impinges thereon; and (viii) calculating a beam landing error using a characteristic of said phosphor element and at least some of said measured light intensities and corresponding magnetic field magnitudes. ### Claim 18 (depends on 17) The method of claim 17 wherein said characteristic is a dimension of said phosphor element. ### Claim 19 (depends on 18) The method of claim 18 wherein said beam landing error is calculated using the formula: ##EQU5## where: dI1' and dI2' are differences between normalized light intensities measured at step (i); dW1 and dW2 are differences between the magnitudes of the magnetic fields corresponding to the light intensities measured at step (i); W6 is the magnetic field corresponding to the intersection point of said first straight line and said second straight line; and PW is the dimension of said phosphor element in the direction of deflection of said electron beam. ### Claim 20 A method of calculating beam landing errors in a color picture tube having a phosphor screen including a plurality of spaced, red, green and blue phosphor stripes, electron guns to generate red, green and blue electron beams to impinge on corresponding phosphor stripes and a shadow mask interposed between said electron guns and said phosphor screen, said method comprising the steps of: (i) generating a magnetic field having a first magnitude to deflect an electron beam relative to the corresponding phosphor stripe on which said electron beam is to impinge and measuring the intensity of light emitted by said phosphor stripe as said electron beam impinges thereon; (ii) reversing the polarity of said magnetic field and repeating step (i) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said first magnitude; (iii) generating a magnetic field having a second magnitude different from said first magnitude to deflect an electron beam relative to the corresponding phosphor stripe on which said electron beam is to impinge and measuring the intensity of light emitted by said phosphor stripe as said electron beam impinges thereon; (iv) reversing the polarity of said magnetic field and repeating step (iii) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said second magnitude; (v) calculating a first straight line approximating the light intensities measured at step (i) and a second straight line approximating the light intensities measured at step (iii), said first straight line and second straight line intersecting one another; (vi) determining an intersection point of said first straight line and said second straight line and a magnetic field magnitude corresponding to the intersection point; (vii) generating a magnetic field having a magnitude corresponding to the intersection point and measuring the intensity of light emitted by said phosphor stripe as said electron beam impinges thereon; and (viii) calculating a beam landing error using a characteristic of said phosphor stripe and at least some of said measured light intensities and corresponding magnetic field magnitudes. ### Claim 21 (depends on 20) The method of claim 20 wherein said first straight line and said second straight line are determined using a straight line approximation. ### Claim 22 (depends on 20) The method of claim 20 wherein said light intensities are approximated using a higher order function and wherein said first straight line and said second straight line are determined from said high order function. ### Claim 23 (depends on 22) The method of claim 22 wherein said higher order function is a hyperbola and wherein said first straight line and said second straight line are determined by the asymptote thereof. ### Claim 24 A method of calculating beam landing errors in a color picture tube having a phosphor screen including a plurality of spaced, red, green and blue phosphor stripes, electron guns to generate red, green and blue electron beams to impinge on corresponding phosphor stripes and a shadow mask interposed between said electron guns and said phosphor screen, said method comprising the steps of: (i) generating a magnetic field having a first magnitude to deflect an electron beam relative to the corresponding phosphor stripe on which said electron beam is to impinge and measuring the intensity of light emitted by said phosphor stripe as said electron beam impinges thereon; (ii) reversing the polarity of said magnetic field and repeating step (i) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said first magnitude; (iii) generating a magnetic field having a second magnitude different from said first magnitude to deflect an electron beam relative to the corresponding phosphor stripe on which said electron beam is to impinge and measuring the intensity of light emitted by said phosphor stripe as said electron beam impinges thereon; (iv) reversing the polarity of said magnetic field and repeating step (iii) thereby to measure at least two different light intensities influenced by each polarity magnetic field of said second magnitude; (v) calculating a first straight line approximating the light intensities measured at step (i) and a second straight line approximating the light intensities measured at step (iii), said first straight line and second straight line intersecting one another; (vi) determining an intersection point of said first straight line and said second straight line and a magnetic field magnitude corresponding to the intersection point; (vii) generating a magnetic field having a magnitude corresponding to the intersection point and measuring the intensity of light emitted by said phosphor stripe as said electron beam impinges thereon; and (viii) calculating a beam landing error using the formula: ##EQU6## where: dI1' and dI2' are differences between normalized light intensities measured at step (i); dW1 and dW2 are differences between the magnetic fields corresponding to the light intensities measured at step (i); W6 is the magnetic field corresponding to the intersection point of said first straight line and said second straight line; and PW is the width of said phosphor stripe. ### Claim 25 (depends on 24) The method of claim 24 wherein steps (i) to (iii) are performed three or more times. ### Claim 26 (depends on 24) The method of claim 24 wherein said first straight line and said second straight line are determined using a straight line approximation. ### Claim 27 (depends on 24) The method of claim 24 wherein said intensities are approximated using a higher order function and wherein said first straight line and said second straight line are determined from said higher order function. ### Claim 28 (depends on 27) The method of claim 27 wherein said higher order function is a hyperbola and wherein said first straight line and said second straight line are determined by the asymptote thereof.