Method for operating an active matrix display device with limited variation in threshold voltages

A method for operating an active matrix display device having an active matrix circuit, a column driver circuit and a scan driver circuit, said method comprising the steps of:

• driving said active matrix circuit by said column driver circuit and said scan driver circuit;
• wherein each of said active matrix circuit, said column driver circuit and said scan driver circuit is constituted by a plurality of thin film transistors;
• wherein a difference of threshold voltages between at least one pair of adjacent thin film transistors which constitutes said column driver circuit is not greater than 0.01V, and
• wherein variation in threshold voltages of the thin film transistors which constitute said column driver circuit is smaller than the variation in the threshold voltages of the thin film transistors which constitute said scan driver circuit.

A method for operating an active matrix display device having an active matrix circuit, a column driver circuit and a scan driver circuit, said method comprising the steps of:

• driving said active matrix circuit by said column driver circuit and said scan driver circuit;
• wherein each of said active matrix circuit, said column driver circuit and said scan driver circuit is constituted by a plurality of thin film transistors;
• wherein a difference of threshold voltages between at least one pair of adjacent thin film transistors thin film which constitutes said column driver circuit is not greater than 0.01V, and
• wherein variation in threshold voltages of the thin film transistors which constitute said column driver circuit is smaller than the variation in the threshold voltages of the thin film transistors which constitute said active matrix circuit.

A method for operating an active matrix display device having an active matrix circuit, a column driver circuit and a scan driver circuit, wherein said column driver circuit includes an analog circuit, said method comprising the steps of:

• driving said active matrix circuit by said column driver circuit and said scan driver circuit;
• wherein each of said active matrix circuit, said column driver circuit and said scan driver circuit is constituted by a plurality of thin film transistors;
• wherein variation in threshold voltages of the thin film transistors which constitute said column driver circuit is smaller than the variation in the threshold voltages of the thin film transistors which constitute said scan driver circuit,
• wherein the variation in the threshold voltages of the thin film transistors which constitute in said column driver circuit is not greater than 0.05V.

A method for operating a active matrix display device having an active matrix circuit, a column driver circuit and a scan driver circuit, said method comprising,

• driving said active matrix circuit by said column driver circuit and said scan driver circuit;
• wherein each of said active matrix circuit, said column driver circuit and said scan driver circuit is constituted by a plurality of thin film transistors;
• wherein variation in threshold voltages of the thin film transistor which constitute said column driver circuit is smaller than the variation in the threshold voltages of the thin film transistors which constitute said active matrix circuit;
• wherein the variation in the threshold voltages of the thin film transistors which constitute said column driver circuit is not greater than 0.05V.

A method of operating an active matrix display device having an active matrix circuit, a column driver circuit and a scan driver circuit, wherein said column driver circuit includes an analog circuit, said method comprising the steps of:

• driving said active matrix circuit by said column driver circuit and said scan driver circuit;
• wherein each of said active matrix circuit, said column driver circuit and said scan driver circuit is constituted by a plurality of thin film transistors;
• wherein variation in threshold voltages of the thin film transistors which constitute said column driver circuit is smaller than the variation in the threshold voltages of the thin film transistors which constitute said scan driver circuit,
• wherein a difference of threshold voltages between adjacent ones of the thin film transistors which constitute said analog circuit is not greater than 0.01 V.

A method of manufacturing an active matrix display device having an active matrix circuit, a column driver circuit and a scan driver circuit, wherein said column driver circuit including an analog circuit, said method comprising the steps of:

• driving said active matrix circuit by said column driver circuit and said scan driver circuit;
• wherein each of said active matrix circuit, said column driver circuit and said scan driver circuit is constituted by a plurality of thin film transistors;
• wherein variation in threshold voltages of the thin film transistors which constitute said column driver circuit is smaller than the variation in the threshold voltages of the thin film transistors which constitute said active matrix circuit,
• wherein a difference of threshold voltages between adjacent ones of the thin film transistors which constitute said analog circuit is not greater than 0.01 V.

A method for operating an active matrix display device having an active matrix circuit, a column driver circuit and a scan driver circuit, wherein said column driver circuit includes a analog circuit, said method comprising the steps of:

• driving said active matrix circuit by said column driver circuit and said scan driver circuit;
• wherein each of said active matrix circuit, said column driver circuit and said scan driver circuit is constituted by a plurality of thin film transistors;
• wherein a difference of threshold voltages between at least one pair of adjacent thin film transistors which constitutes said analog circuit is not greater than 0.01V, and
• wherein variation in threshold voltages of the thin film transistors which constitute said column driver circuit is smaller than the variation in the threshold voltages of the thin film transistors which constitute said scan driver circuit.

A method for operating an active matrix display device having an active matrix circuit, a column driver circuit and a scan driver circuit, wherein said column driver circuit includes an analog circuit, said method comprising the steps of:

• driving said active matrix circuit by said column driver circuit and said scan driver circuit;
• wherein each of said active matrix circuit, said column driver circuit and said scan driver circuit is constituted by a plurality of thin film transistors;
• wherein a difference of threshold voltages between at least one pair of adjacent thin film transistors which constitutes said analog circuit is not greater than 0.01V, and
• wherein variation in threshold voltages of the thin film transistors which constitute said column driver circuit is smaller than the variation in the threshold voltages of the thin film transistors which constitute said active matrix circuit.