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US 6,067,859 AGranted
Optical stretcher
AssigneeBoard of Regents, The University of Texas System
InventorsJosef A. Kas, Jochen R. Guck
Life of this patent
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Abstract
This invention concerns a novel optical micromanipulation tool, referred to as the optical stretcher, which may use a tunable laser to trap and deform cells between two counterpropogating beams generated by the laser. It is possible to detect the deformation of cancer cells.
Claims20
An apparatus, comprising:
- a stage capable of supporting micron-sized dielectric particles;
- two or more sources of laser light directed toward an area of the stage where the particles are located;
- a first detector which determines whether a particle is trapped between the laser sources;
- a second detector which determines and measures deformation of a particle upon increasing intensity of the laser light;
- wherein the laser sources are adjustable so that the power of the laser light is to thereby trap a particle and then stretch the particle toward the two or more laser sources.
2 more elements
An apparatus, comprising:
- a stage capable of supporting micron-sized dielectric particles;
- two or more sources of laser light directed toward an area of the stage where the particles are located;
- a first detector which determines whether a particle is trapped between the laser sources;
- a second detector which determines and/or measures formation of a particle upon increasing intensity of the laser light;
- wherein laser sources are adjustable so that the power of the laser light is variable to thereby trap and then stretch the particle toward the two or more laser,
- wherein the detector determines the deformation by measuring the variance in current through an aqueous medium between two assymetric pin holes between which the particle is trapped.
3 more elements
A process for the controlled deformation of micron-sized dielectric particles, comprising:
- exposing a particle to two or more counterpropagating laser beams at intensities and under conditions effective to deform the particle by stretching the particle toward the two or more laser sources to thereby deform the part;
- and
- optionally measuring the deformation of the particle.
A process for the controlled deformation of micron-sized dielectric particles, comprising:
- exposing a particle to two or more counterpropagating laser beams at an intensity and under conditions effective to deform the particle;
- and
- optionally measuring the deformation of the particle by stretching the particle toward the two or more laser sources to thereby deform the particle,
- wherein the measuring occurs by measuring the variance in current through an aqueous medium between two asymmetric pin holes between which the particle is trapped.
1 more element
Dependencies are inferred from the claim text.