Fabrication of semiconductor devices
AssigneeLucent Technologies Inc.
InventorsPatrick J. Doran, James F. Dormer, Patrick J. Drummond, Daniel Kern
Life of this patent
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Abstract
Disclosed is a method for fabricating devices so that several devices at a time can be tested and sorted. The devices are placed in a carrier so that each device occupies a discrete position. The carrier includes an identification marker, and each device is identified by its position in the carrier. The carrier is sent to multiple assembly and/or testing stations, and data for each device is collected and stored in a central data base according to its position in the carrier. Each device may then be sorted according to the collected data and its position in the carrier.
Claims8
A method for testing semiconductor devices comprising the steps of:
- providing a carrier which includes a plurality of discrete positions, the carrier including an identification marker;
- placing a plurality of such devices in the carrier so that each device occupies one of the discrete positions and each device is identified by its position in the carrier;
- sending the carrier through at least one testing station so that each device in the carrier is tested;
- and
- collecting data for each device from the test according to its position in the carrier.
Dependencies are inferred from the claim text.