Magnetron sputtering method and sputtering target
AssigneeKabushiki Kaisha Toshiba
InventorsKatsutaro Ichihara, Kohichi Tateyama, Ryo Sakai, Takashi Ishigami
Life of this patent
Estimating the term…
Abstract
A magnetron sputtering method using a sputtering target consisting of a material having a maximum relative magnetic permeability of 50 or more or consisting of a soft magnetic material which contains two or more phases selected from the group consisting of an M--X alloy phase, an M phase, and an X phase in that at least the simple substance phase consisting of an element having a smaller atomic weight of M and X is included, with the proviso that M.noteq.X, M is at least one element selected from the group consisting of Fe, Co and Ni, and X is at least one element selected from the group consisting of Fe, Al, Si, Ta, Zr, Nb, Hf and Ti.
Claims15
A magnetron sputtering method comprising:
- disposing a substrate opposite an upper surface of a sputtering target;
- applying a magnetic field to the sputtering target from a magnetic field source disposed on a rear surface of the sputtering target to generate magnetron discharge over the upper surface of the sputtering target;
- and
- applying a sputtering voltage to the sputtering target thereby sputtering a magnetic thin film on the substrate,
- wherein said sputtering target consists of a soft magnetic material having a maximum relative magnetic permeability of about 50 or more and contains an M--X alloy phase and at least one phase selected from the group consisting of an M simple substance phase and an X simple substance phase with the at least one phase selected being the simple substance phase having a smallest atomic weight relative to each simple substance phase constituent M and X where the constituent M includes at least one element selected from the group consisting of Fe, Co, and Ni and has a different atomic weight than the constituent X which includes at least one element selected from the group consisting of Fe, Al, Si, Ta, Zr, Nb, Hf, and Ti, and
- wherein said sputtering target is formed with at least a part of the M--X alloy phase being surrounded by the selected at least one simple substance phase.
A magnetron sputtering method comprising:
- disposing a substrate opposite to an upper surface of a sputtering target;
- applying a magnetic field to the sputtering target from a magnetic field source disposed on a rear surface of the sputtering target to generate magnetron discharge over the upper surface of the sputtering target;
- and
- applying a sputtering voltage to the sputtering target thereby sputtering a magnetic thin film on the substrate,
- wherein said sputtering target consists of a material having a maximum relative magnetic permeability of about 50 or more and contains two phases of an M--X alloy phase and an M simple substance phase with M including at least one element selected from the group consisting of Fe, Co, and Ni and having a smaller atomic weight than X which includes at least one element selected from the group consisting of Fe, Al, Si, Ta, Zr, Nb, Hf, and Ti, and
- wherein said sputtering target is formed with at least a part of the M--X alloy phase being surrounded by the M simple substance phase.
A magnetron sputtering method comprising:
- disposing a substrate opposite to an upper surface of a sputtering target;
- applying a magnetic field to the sputtering target from a magnetic field source disposed on a rear surface of the sputtering target to generate magnetron discharge over the upper surface of the sputtering target;
- providing an atmosphere containing nitrogen between at least the sputtering target and the substrate;
- applying a sputtering voltage to the sputtering target thereby sputtering a nitride magnetic film on the substrate;
- wherein said sputtering target consists of a material having a maximum relative magnetic permeability of about 50 or more and contains an M--X alloy phase and at least one phase selected from the group consisting of an M simple substance phase and an X simple substance phase with the at least one phase selected being the simple substance phase having a smallest atomic weight relative to each simple substance phase constituent M and X, where the constituent M includes at least one element selected from the group consisting of Fe, Co, and Ni and has a different atomic weight than the constituent X which includes at least one element selected from the group consisting of Fe, Al, Si, Ta, Zr, Nb, Hf, and Ti, and
- wherein said sputtering target is formed with at least a part of the M--X alloy phase being surrounded by the selected at least one simple substance phase.
A magnetron sputtering method comprising:
- disposing a substrate opposite to an upper surface of a sputtering target;
- applying a magnetic field to the sputtering target from a magnetic field source disposed on a rear surface of the sputtering target to generate magnetron discharge over the upper surface of the sputtering target;
- and
- applying a sputtering voltage to the sputtering target thereby sputtering a magnetic thin film on the substrate,
- wherein said sputtering target consists of a material having a maximum relative magnetic permeability of about 50 or more and contains an M--X alloy phase and at least one phase selected from the group consisting of an M simple substance phase and an X simple substance phase with the at least one phase selected being the simple substance phase having a smallest atomic weight relative to each simple substance phase constituent M and X, where the constituent M includes at least one element selected from the group consisting of Fe, Co, and Ni and has a different atomic weight than the constituent X which includes at least one element selected from the group consisting of Fe, Al, Si, Ta, Zr, Nb, Hf, and Ti,
- wherein a ratio of the phases constituting said sputtering target is determined on the basis of atomic flux densities of the M constituent and the X constituent which will maintain the M/X ratio of the magnetic thin film being sputtered on the substrate constant as the sputtering target erodes, and
- wherein said sputtering target is formed with at least a part of the M--X alloy phase being surrounded by the selected at least one simple substance phase.
A magnetron sputtering method comprising:
- disposing a substrate opposite to an upper surface of a sputtering target;
- applying a magnetic field to the sputtering target from a magnetic field source disposed on a rear surface of the sputtering target to generate magnetron discharge over the upper surface of the sputtering target;
- and
- applying a sputtering voltage to the sputtering target thereby sputtering a magnetic thin film on the substrate,
- wherein said sputtering target consists of a soft magnetic material having a maximum relative magnetic permeability of about 50 or more and contains an M--X alloy phase, an M simple substance phase, and an X simple substance phase, and where the constituent M includes at least one element selected from the group consisting of Fe, Co, and Ni and has a different atomic weight than the constituent X which includes at least one element selected from the group consisting of Fe, Al, Si, Ta, Zr, Nb, Hf and Ti,
- and wherein said sputtering target is formed with at least a part of the M--X alloy phase being surrounded by one of the M simple substance phase and the X simple substance phase.
Dependencies are inferred from the claim text.