Apparatus and methods for contour measurement using movable sources
AssigneeMassachusetts Institute of Technology
InventorLyle Shirley
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AssigneeMassachusetts Institute of Technology
InventorLyle Shirley
Estimating the term…
Apparatus and methods of measuring position information of a point on the surface of an object. In one embodiment, the apparatus includes two sources of radiation positioned to illuminate the point on the surface of the object with radiation from each of the sources. The radiation from each of the sources is coherent with respect to the radiation from the other source. A control system moves each of the sources relative to the other and changes the phase of the radiation from at least one of the sources relative to the phase of the radiation from the other source as measured at the point on the surface of the object. A detector is positioned to receive radiation scattered by the point and a processor in communication with the detector calculates position information in response to the change in phase of the radiation from the source and the received radiation scattered by the point on the surface of the object.
A method for determining, on an object having a surface, three-dimensional position information of a point on said surface of said object, said method comprising the steps of:
An apparatus for determining, on an object having a surface, position information of a point on said surface of said object, said apparatus comprising:
A method for determining, on an object having a surface, position information of a point on said surface of said object, said method comprising the steps of:
An apparatus for determining, on an object having a surface, a depth coordinate of a point on said surface of said object, said apparatus comprising:
Dependencies are inferred from the claim text.