Electrical connecting apparatus for electrically connecting a device to be tested
AssigneeKabushiki Kaisha Nihon Micronics
InventorsYoshiei Hasegawa, Eichi Osato
Life of this patent
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Abstract
The connecting apparatus has a plurality of probes, each having a deformed portion, a needle front portion with a tip end to be pressed against an electrode portion of a device to be tested and continuous with the deformed portion, and a needle tail portion continuous with the other end portion of the deformed portion, assembled in parallel into a base plate by assembling equipment with the tail end portions brought into contact with a retraction preventive portion. Thereby, when device to be tested is pressed against the probe, the probe is prevented from retracting according to the curved state of the deformed portion.
Claims13
A connecting apparatus adapted to be electrically connected with a device to be tested, the device having a plurality of electrode portions, the connecting apparatus comprising:
- a base plate, one face of said base plate including a conductive portion formed thereon;
- a plurality of probes, each electrically connecting said electrode portions and said conductive portion;
- and
- an assembling equipment for assembling said probes in parallel into said base plate,
- wherein each probe includes a deformed portion, a needle front portion continuous with one end of said deformed portion, said needle front portion having a needle tip to be pressed against each of the electrode portions of the device;
- and a needle tail portion continuous with the other end of said deformed portion, and
- wherein said assembling equipment is provided with a retraction preventive portion for preventing said probes from retracting, and an elastically deformable needle presser portion to be in contact with said deformed portions or said needle tail portions of said probes, and said probes bring said tail end portions into contact with said retraction preventive portion.
A connecting apparatus comprising:
- a base plate having a plurality of conductive portions on one face;
- a plurality of probes for electrically connecting electrode portions of a device to be tested and said conductive portions, respectively;
- and
- an assembling equipment for assembling said probes in parallel into said base plate,
- wherein each probe is provided with a curved deformed portion, a needle front portion continuous with one end of said deformed portion and having a tip end to be pressed against each of the electrode portions of the device to be tested, and a needle tail portion continuous with the other end of said deformed portion, and
- wherein said assembling equipment includes a retraction preventive portion for preventive said probes from retracting, and an elastically deformable needle presser portion in contact with said probes so as to bring at least a part of each of said deformed portions or said needle tail portions into contact with said conductive portions, respectively, said probes bringing said tail end portions into contact with said retraction preventive portion.
Dependencies are inferred from the claim text.