Micromechanical potentiometric sensors
AssigneeLockheed Martin Energy Research Corporation
InventorThomas G. Thundat
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AssigneeLockheed Martin Energy Research Corporation
InventorThomas G. Thundat
Estimating the term…
A microcantilever potentiometric sensor utilized for detecting and measuring physical and chemical parameters in a sample of media is described. The microcantilevered spring element includes at least one chemical coating on a coated region, that accumulates a surface charge in response to hydrogen ions, redox potential, or ion concentrations in a sample of the media being monitored. The accumulation of surface charge on one surface of the microcantilever, with a differing surface charge on an opposing surface, creates a mechanical stress and a deflection of the spring element. One of a multitude of deflection detection methods may include the use of a laser light source focused on the microcantilever, with a photo-sensitive detector receiving reflected laser impulses. The microcantilevered spring element is approximately 1 to 100 .mu.m long, approximately 1 to 50 .mu.m wide, and approximately 0.3 to 3.0 .mu.m thick. An accuracy of detection of deflections of the cantilever is provided in the range of 0.01 nanometers of deflection. The microcantilever apparatus and a method of detection of parameters require only microliters of a sample to be placed on, or near the spring element surface. The method is extremely sensitive to the detection of the parameters to be measured.
An apparatus for detecting and measuring physical and chemical parameters in a sample of monitored media, comprising:
A method for detecting and measuring chemical and physical parameters in a sample of monitored media, comprising the steps of:
An apparatus for detecting and measuring physical and chemical parameters in a sample of monitored media, comprising:
Dependencies are inferred from the claim text.