Universal cold-cathode type ion source with closed-loop electron drifting and adjustable ion-emitting slit
AssigneeAdvanced Ion Technology, Inc.
InventorsYuri Maishev, James Ritter, Leonid Velikov
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AssigneeAdvanced Ion Technology, Inc.
InventorsYuri Maishev, James Ritter, Leonid Velikov
Estimating the term…
A universal cold-cathode type ion source with a closed-loop electron drifting source and with an ion-beam propagation direction perpendicular to the plane of electron drifting is intended for uniformly treating stationary or moveable objects with such processes as cleaning, activation, polishing, thin-film coating, or etching. The ion source of the invention allows adjustment of beam parameters and configurations and has an ion emitting slit of an adjustable geometry. In one embodiment, the adjustment is carried out by changing the width of the slit by shifting moveable parts of the cathode in the direction perpendicular to the direction of the ion beam. In another embodiment the slit configuration is adjusted by shifting a moveable part of the cathode in the direction of the beam propagation. The invention also provides a method for adjusting the shape and configuration of the ion beam with respect to the object to be treated. The adjustment can be performed during the operation of the ion beam while observing the beam through a sealed transparent window of the vacuum chamber.
A universal ion beam source with a closed-loop ion-emitting slit capable of emitting an ion beam toward an object located in a position reachable by said ion beam, comprising:
A method for adjusting performance characteristics of an ion beam source with a closed-loop ion emitting slit of predetermined geometric dimensions, comprising the steps of:
A method for adjusting performance characteristics of an ion beam source with a closed-loop ion emitting slit of predetermined geometric dimensions, comprising the steps of:
A method for adjusting performance characteristics of ion beam source with a closed-loop ion emitting slit of predetermined geometric dimensions, comprising the steps of:
A method for adjusting performance characteristics of ion beam source with a closed-loop ion emitting slit of predetermined geometric dimensions, comprising the steps of:
Dependencies are inferred from the claim text.