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US 5,999,253 AGranted
Apparatus and method for spectrometry
AssigneeAstra Aktiebolag
InventorFrans Langkilde
Life of this patent
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AssigneeAstra Aktiebolag
InventorFrans Langkilde
Estimating the term…
A device and a method are intended for use in a spectroscopic analysis, especially performed with the aid of Raman spectroscopy, of a solid sample, such as a tablet (1). By means of a sample holder (7), the sample (1) is positioned in relation to an excitation beam which, during implementation of the analysis, falls upon a reception surface of the sample (1), the impingement area (S) being smaller than the reception surface of the sample (1). The sample holder (7) is rotated about an axis of rotation (A) parallel to the excitation beam, such that the point of impingement (S) of the excitation beam describes an annular scanning trace (20) on the reception surface of the sample (1). During implementation of the analysis, the radius of the annular scanning trace (20) is varied to enable a fairly large volume of the sample to be analysed.
A device (4) for performing a spectroscopic analysis of a solid sample, said device (4) comprising a sample holder (7) for positioning the sample (1) in relation to an excitation beam which, during implementation of the analysis, falls upon a reception surface of the sample (1), the impingement area (S) being smaller than the reception surface of the sample (1), the device further comprising a drive means (5) for causing the sample holder (7) to rotate about an axis of rotation (A) parallel to the excitation beam, such that the point of impingement (S) of the excitation beam describes an annular scanning trace (20) on the reception surface of the sample (1), and means for optionally varying the radius (R) of the annular scanning trace (20) during implementation of the analysis.
A method for performing a spectroscopic analysis of a solid sample, comprising the steps of generating an excitation beam and positioning the sample (1) by means of a sample holder (7) in relation to the excitation beam, such that the latter falls upon a reception surface of the sample (1), the impingement area (S) being smaller than the reception surface of the sample (1), the method further comprising the steps of rotating the sample holder (7) about an axis of rotation (A) parallel to the excitation beam, such that the point of impingement (S) of the excitation beam describes an annular scanning trace (20) on the reception surface of the sample (1), and varying the radius (R) of the annular scanning trace (20) during implementation of the analysis.
Dependencies are inferred from the claim text.