Method and apparatus for asynchronously measuring frequency shifted signals
OwnerRichard C. Cabotinventor
Life of this patent
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Abstract
A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.
Claims16
A method for measuring the electrical signal transfer characteristics of an electrical signal transfer device under test, said device having an input and an output, wherein the original frequency of one component of an electrical test signal applied to said input is known, comprising the steps of:
- (a) acquiring an electrical signal in digital form from said output of said device under test;
- (b) performing a time-to-frequency transform on said acquired electrical signal to determine its spectral characteristics;
- (c) determining the shift in frequency of a selected component of said acquired electrical signal from said known original frequency of said one component of said test signal;
- (d) interpolating between acquisition values of said acquired electrical signal to create new values corresponding to an electrical signal having a frequency component substantially equal to said known original frequency of said one component, thereby transforming said acquired electrical signal into another;
- and
- (e) computing, from said new values, selected signal transfer characteristics of said device under test.
A method for measuring the electrical signal transfer characteristics of an electrical signal transfer device under test, said device having an input and an output, comprising the steps of:
- (a) simultaneously applying to said input of said device under test a plurality of distinct, substantially sinusoidal, electrical test signals selected so that their frequencies are integer multiples of a common frequency;
- (b) acquiring an electrical signal from said output of said device under test;
- (c) performing a time-to-frequency transform on said acquired electrical signal to determine the frequencies thereof;
- (d) comparing one or more frequencies of said acquired electrical signal to the frequency of one or more of said electrical test signals to determine the extent to which the frequency of any of said test signals has been shifted;
- (e) interpolating between adjacent acquisition values of said acquired electrical signal to create new values corresponding to an electrical signal having frequency components that are integer multiples of a common frequency substantially equal to the common frequency of said electrical test signals, thereby transforming said acquired electrical signal into another;
- and
- (f) computing, from said new values, selected signal transfer characteristics of said device under test.
An apparatus for measuring the electrical signal transfer characteristics of an electrical signal transfer device under test, said device having an input and an output, wherein the original frequency of one component of an electrical test signal applied to said input is known, comprising:
- (a) acquisition means for acquiring an electrical signal in digital form from said output of said device under test;
- (b) transform means for performing a time-to-frequency transform on said acquired electrical signal to determine its spectral characteristics;
- (c) determination means for determining the shift in frequency of a selected component of said acquired electrical signal from said known original frequency of said one component of said test signal;
- (d) interpolation means for interpolating between acquisition values of said acquired electrical signal to create new values corresponding to an electrical signal having a frequency component substantially equal to said known original frequency of said one component, thereby transforming said acquired electrical signal into another;
- and
- (e) computing means for computing, from said new values, selected signal transfer characteristics of said device under test.
An apparatus for measuring the electrical signal transfer characteristics of an electrical signal transfer device under test, said device having an input and an output, comprising:
- (a) application means for simultaneously applying to said input of said device under test a plurality of distinct, substantially sinusoidal, electrical test signals selected so that their frequencies are integer multiples of a common frequency;
- (b) acquisition means for acquiring an electrical signal from said output of said device under test;
- (c) transform means for performing a time-to-frequency transform on said acquired electrical signal to determine the frequencies thereof;
- (d) comparison means for comparing one or more frequencies of said acquired electrical signal to the frequency of one or more of said electrical test signals to determine the extent to which the frequency of any of said test signals has been shifted;
- (e) interpolation means for interpolating between adjacent acquisition values of said acquired electrical signal to create new values corresponding to an electrical signal having frequency components that are integer multiples of a common frequency substantially equal to the common frequency of said electrical test signals, thereby transforming said acquired electrical signal into another;
- and
- (f) computing means for computing, from said new values, selected signal transfer characteristics of said device under test.
Dependencies are inferred from the claim text.