System or method for detecting defect within a semi-opaque enclosure
AssigneeCognex Corporation
InventorSanjay Nichani
Life of this patent
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AssigneeCognex Corporation
InventorSanjay Nichani
Estimating the term…
A method and system detect for the presence of a defect or a non-conforming object of unknown shape, configuration, and location within a semi-opaque enclosure. The semi-opaque enclosure has a pattern which is visible on at least a first of its external surfaces. The semi-opaque enclosure may comprise, for example, a labeled plastic or glass bottle, and the visible pattern may be print and graphical information provided on the bottle's label. A first digital image is captured from first channel light reflected off the first external surface of the enclosure; and a second digital image is captured from second channel light navigating the object inside the enclosure and emanating from the first external surface of the enclosure. A difference image is formed substantially devoid of information representing the visible pattern on the first external surface, by subtracting one of the first and second digital images from the other. Additional segmentation processing may be performed on the difference image in order to better identify the presence of a defect or non-conforming object within the semi-opaque enclosure.
A method for detecting an object of unknown shape, configuration, and location on an inner wall surface of a rigid semi-opaque enclosure having a semi-opaque first side portion having first internal and external surfaces and a semi-opaque second side portion having second internal and external surfaces, said first side portion being different from and opposing said second side portion, said first external surface having a pattern visible externally to said enclosure, said method comprising:
Dependencies are inferred from the claim text.