Iconized DMIS
AssigneeInternational Metrology Systems, Inc.
InventorDenny He
Life of this patent
Estimating the term…
Abstract
An icon based DMIS program allows for simplified and enhanced use in a coordinate measurement machine environment. Each listed icon is associated with an underlying DMIS code. Double clicking on a DMIS icon will open a window which shows the underlying DMIS code for that icon, allowing changes to be made to that DMIS code. Both the Iconized DMIS list as well as the DMIS window allow for full editing capabilities such as deletions, insertions, change of numerical values and copy/paste facilities.
Claims8
A method for coordinate measurement and inspection for use in a coordinate measurement machine environment, comprising the steps of:
- providing icons corresponding to underlying DMIS code;
- selecting said icons in a desired sequence;
- opening a DMIS command line window upon the selection of an icon to allow for changes to the underlying DMIS code;
- and
- performing coordinate measurement and inspection according to the step of selecting said icons in a desired sequence.
An improved method for coordinate measurement and inspection in use with a coordinate measurement machine having a sensor operable via a machine control unit, said improved method comprising the steps of:
- providing icons corresponding to underlying DMIS code;
- selecting said icons to execute a DMIS command corresponding to said underlying DMIS code;
- opening a DMIS command line window upon the selection of an icon to allow for editing of the underlying DMIS code;
- and
- repeating the step of selecting until desired measurement and inspection is complete.
A method for coordinate measurement and inspection for use in a coordinate measurement machine environment, comprising the steps of:
- providing at least one of a plurality of feature definition icons corresponding to underlying DMIS code for allowing entry of nominal definitions of corresponding features, a plurality of feature measurement icons corresponding to underlying DMIS code for allowing feature measurement of corresponding features, a plurality of feature construction icons corresponding to underlying DMIS code for executing mathematical calculations of corresponding features, a plurality of sensor handling icons corresponding to underlying DMIS code for allowing selection of corresponding sensor operations, and a plurality of measuring device parameter icons corresponding to underlying DMIS code for allowing selection of corresponding measuring device parameters;
- selecting said at least one of said icons in a desired sequence;
- opening a DMIS command line window upon the selection of at least one of said icons to allow for editing of the underlying DMIS code;
- and
- performing coordinate measurement and inspection according to the step of selecting said at least one of said icons in a desired sequence.
Dependencies are inferred from the claim text.