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US 5,970,116 AGranted
Method of determining the density profile of a plate-shaped material
AssigneeWesser & Dueholm
InventorsSten Dueholm, Steen Teller
Life of this patent
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AssigneeWesser & Dueholm
InventorsSten Dueholm, Steen Teller
Estimating the term…
A method of non-destructively, on-line determining the density profile in a plate-shaped material with a density which varies discretely or continuously over the plate thickness, while the density at a specific depth of the plate is assumed to be constant, such as for instance plates based on wood, by means of X-rays or gamma rays from a source placed on one side of the plate. Two detectors are placed on the other side of the plate, one detector measuring in the emitting direction of the source and the other detector measuring in the other direction and being movable relative to the plate. The counting number of the second detector is adjusted by means of the counting number of the first detector. By a suitable choice of emitting direction and detecting direction it is possible to provide a measurement of the density in a specific measuring volume merely by dividing the counting number of the second detector by the counting number of the first detector. As a result, the attenuation in the material is left out. The angle of incidence must be substantially identical with the angle of reflection.
A method of determining the density profile of a plate-shaped material M of a density varying discretely or continuously across the plate thickness, while the density at a specific depth of the plate is substantially constant, by means of X-rays or gamma rays from a source K placed on one side of the plate M, comprising at least a first detector T and a second detector F arranged on the other side of the plate M advanced through the measuring device in the longitudinal direction, whereby the first detector T is placed in the emitting direction of the source K and measures the radiation transmitted through the plate M, and the at least one second detector F is placed outside the emitting direction of the source K and measures the scattered radiation from partial volumes along the emitting direction of the source K, the second detector F being displaced relative to the first detector T while the detecting direction is maintained, wherein the detecting direction of the second detector F is chosen relative to the emitting direction of the source K in such a manner that the density is expressed directly as a proportion between the radiation measured by each of the first and second detectors, and an angle of incidence V between the emitting direction and the plate M is almost identical with an angle of reflection W between the plate and the second detector.
A method of determining the density profile of a plate-shaped material of a density varying discretely or continuously across the plate thickness, while the density at a specific depth of the plate is substantially constant, by means of X-rays or gamma rays from a source placed on one side of the plate, comprising at least a first detector and a second detector arranged on the other side of the plate advanced through the measuring device in the longitudinal direction, whereby the first detector is placed in the emitting direction of the source and measures the radiation transmitted through the plate, and the second detector is placed outside the emitting direction of the source and measures the scattered radiation from partial volumes along the emitting direction of the source, the second detector being displaced relative to the first detector and parallel to the emitting direction of the source, while the detecting direction is maintained, wherein the detecting direction of the second detector is chosen relative to the emitting direction of the source in such a manner that the density is expressed directly as a proportion between the radiation measured by the first and second detectors, and an angle of incidence between the emitting direction and the plate is almost identical with an angle of reflection between the plate and the second detector.
Dependencies are inferred from the claim text.