Ferroelectric memory devices having linear reference cells therein and methods of operating same
AssigneeSamsung Electronics Co., Ltd.
InventorBon-jae Koo
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AssigneeSamsung Electronics Co., Ltd.
InventorBon-jae Koo
Estimating the term…
Nonvolatile ferroelectric-based integrated circuit memory devices utilize reference cells containing linear storage capacitors to inhibit deterioration in reliability typically associated with ferroelectric capacitors which have undergone excessive polarization cycling. These linear storage capacitors are preferably coupled to respective plate lines so that efficient reading operations may be performed. In particular, a nonvolatile memory device is preferably provided which contains a ferroelectric memory cell having an access transistor and a ferroelectric storage capacitor therein. A reference cell is also provided and this reference cell contains an access transistor and a linear storage capacitor therein. In addition, a sense amplifier is provided which has first and second inputs electrically coupled to the access transistors of the ferroelectric memory cell and the reference cell, respectively. To improve the efficiency of reading operations, a reset transistor is preferably provided and this transistor is electrically connected in series between the second input of the sense amplifier and a reference signal line (e.g., ground signal line).
A ferroelectric memory device, comprising:
A nonvolatile memory device, comprising:
In an integrated circuit memory device containing a ferroelectric memory cell, a linear reference cell and a sense amplifier electrically coupled to the ferroelectric memory cell and the linear reference cell by a bit line and reference bit line, respectively, a method of reading a state of the ferroelectric memory cell, comprising the steps of:
In an integrated circuit memory device containing a ferroelectric memory cell, a linear reference cell and a sense amplifier electrically coupled to the ferroelectric memory cell and the linear reference cell by a bit line and reference bit line, respectively, a method of operating the memory device, comprising the steps of:
Dependencies are inferred from the claim text.