Radar-based method of measuring the level of a material in a container
AssigneeEndress + Hauser GmbH + Co. KG
InventorsStefen Burger, Carsten Fitsch
Life of this patent
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AssigneeEndress + Hauser GmbH + Co. KG
InventorsStefen Burger, Carsten Fitsch
Estimating the term…
In measuring the level of a material in a container by a radar-based method the echo profile of the received microwaves is registered and a maximum of the echo profile established for determining the microwaves reflected by the material surface. To avoid false readings in the case of a double echo causing in the echo profile a double blip of two overlapping echo blips, consecutive maximum and minimum values of the slope of the echo profile and their distance values are determined starting from the established maximum in the direction towards smaller distances. The amplitude value of the echo profile assigned to the distance value located in the middle between the distance value of the first minimum slope and the distance value of the next maximum slope is used as the peak value of the first echo blip of the double blip decisive for level measuring.
A radar-based method of measuring the level of a material in a container in which, by means of the antenna of a ranging device arranged above the highest level anticipated, microwaves are radiated downwards and reflected microwaves received, the echo profile representing the amplitude values of the received microwaves as a function of the transit time or the distance corresponding to the transit time is registered, a maximum of the echo profile is determined for detecting the echo blip in the echo profile originating from the echo waves reflected by the material surface and the distance of the material surface from the antenna is obtained from the peak value of this echo blip, wherein on occurrence of a double blip comprising two overlapping echo blips, of which the first echo blip originates from the microwaves reflected by the material surface whilst the second echo blip originates from the microwaves reflected by an interface located just below the material surface and has a larger peak value than the first echo blip, the following method steps are put to use for determining the peak value of the first echo blip:
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