Semiconductor device and burn-in method thereof

A circuit for burn-in testing of a semiconductor device, comprising:

• a reference potential generating circuit for generating a reference potential Vref, said reference potential generating circuit having an input for receiving an input signal and an output for outputting said reference potential Vref, a level of the reference potential Vref being varied according to a level of the input signal;
• and
• an input signal applying circuit connected to the input of the reference potential generating circuit, for setting said input signal to one of a plurality of input signal levels and
• switching said input signal from said one of said plurality of input signal levels to another of said plurality of input signal levels, wherein said input signal applying circuit switches said input signal to said one of said plurality of input signal levels when said semiconductor device connected to said output of the reference potential generating circuit is in a normal operation, and said input signal applying circuit switches said input signal to said another of said plurality of input signal levels when said semiconductor device connected to said output of the reference potential generating circuit is in a burn-in operation, thus said semiconductor device being operated according to the level of the reference potential Vref.