Wafer fixing unit for focused ion beam apparatus
AssigneeSamsung Electronics Co., Ltd.
InventorsSang-young Jeon, Jong-chel Park
Life of this patent
Estimating the term…
Loading patent…
AssigneeSamsung Electronics Co., Ltd.
InventorsSang-young Jeon, Jong-chel Park
Estimating the term…
A wafer fixing unit of a FIB (Focused Ion Beam) apparatus, for maintaining the flat zone of a wafer in accurate horizontal alignment, includes a fixed frame in a horizontal plane, having a pair of side plates and a forward plate. A first member is composed of a flat rectangular plate in the horizontal plane having a rectangular depression in a forward section, movably disposed between the pair of side plates and rearward of the forward plate. A second member is defined by a T-shape, arranged substantially parallel and above the horizontal plane wherein a narrow end of the T-shape is connected to the first member and the narrow end fits in the rectangular depression. The second member is movably disposed above the forward plate and has a plurality of projecting parts disposed substantially perpendicular to the horizontal plane for contacting and securing a wafer. A pair of springs connect the first member to the forward plate, to allow movement of the first member to form a rest position and a wafer securing position.
A wafer fixing unit for securing a wafer in a focused ion beam apparatus, comprising:
Dependencies are inferred from the claim text.