Method and apparatus for testing junction strength of electrode
AssigneeDenso Corporation
InventorsKoji Ino, Yusuke Watanabe
Life of this patent
Estimating the term…
Abstract
A probe made of copper and supported by a movable arm via a load cell and a jig has a joining surface having good wettability with solder at the tip end thereof and has a covering portion having poor wettability with the solder around the circumferential periphery. The solder and flux are stuck to the joining surface and the solder is put into contact with a bump electrode to be tested on a substrate in this state. Then, the solder is melted by an induction heating coil and then cooled down and solidified to join the bump electrode to be tested to the probe. The bump electrode is broken by pulling up the probe in this state at a constant speed and at the same time the pulling force exerted on the probe is measured by the load cell.
Claims15
A method for testing a junction strength of an electrode formed on a surface of a substrate, said method comprising the steps of:
- providing a probe formed with a joining surface having good wettability with solder;
- sticking a predetermined amount of solder to the joining surface of said probe;
- heating to melt said solder while maintaining said solder in contact with said electrode to be tested;
- joining said electrode to be tested to said probe by cooling down and solidifying said solder stuck to said joining surface after melting the solder;
- moving said probe in a direction to separate said probe from said electrode to be tested;
- and
- measuring a pulling force exerted on said probe during said moving of said probe.
A method for testing a junction strength of an electrode formed on a surface of a substrate, said method comprising the steps of:
- providing a probe formed with a joining surface having good wettability with solder;
- sticking a predetermined amount of solder to the joining surface of said probe;
- contacting said solder with said electrode to be tested while maintaining said solder in melted condition by heating;
- joining said electrode to be tested to said probe by cooling down and solidifying said solder stuck to said joining surface after melting the solder;
- moving said probe in a direction to separate said probe from said electrode to be tested;
- and
- measuring a pulling force exerted on said probe during said moving of said probe.
An apparatus for testing a junction strength of an electrode formed on the surface of a substrate, said apparatus comprising:
- a probe formed with a joining surface having good wettability with solder;
- heating means for heating and melting solder stuck to the joining surface of said probe;
- moving means for moving said probe;
- controlling means for joining said electrode to be tested to said probe with said solder stuck to said joining surface and for moving said probe in a direction to separate said probe from said electrode to be tested;
- and
- measuring means for measuring pulling force exerted on said probe when said probe is moved in the direction to separate from said electrode to be tested.
Dependencies are inferred from the claim text.