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US 5,965,889 AGranted
Imaging stage for fourier transform infrared spectrometer
AssigneePike Technologies of Wisconsin, Inc.
InventorPhilip R. Brierley
Life of this patent
Estimating the term…
Abstract
An internal reflection element for a Fourier transform infrared spectrometer employs a single lens providing refraction and internal reflection of an infrared beam so as to focus the beam on a centrally located sample surface and to collect and focus radiation reflected from this sample surface for analysis.
Claims8
A stage for a Fourier transform infrared spectrometer, the spectrometer having a source of infrared radiation and a radiation detector, the stage comprising:
- a lens element having opposed first and second surfaces, the surfaces converging at edges of the lens, wherein:
- (i) a first portion of the first surface is shaped to refract a beam of infrared radiation from the source passing through the first portion of the first surface into the lens so as to direct the beam through the lens to a first portion of the second surface;
- (ii) the first portion of the second surface is shaped to reflect the beam through the lens to a second portion of the first surface;
- (iii) the second portion of the first surface is shaped to reflect the beam through the lens to a sample area against which a sample may be placed near the center of the lens on the second surface;
- (iv) the sample area is shaped to reflect the beam through the lens to a third portion of the first surface;
- (v) the third portion of the first surface is shaped to reflect the beam through the lens to a second portion of the second surface;
- (vi) the second portion of the second surface is shaped to reflect the beam through the lens to a fourth portion of the first surface;
- and
- (vii) the fourth portion of the first surface is shaped to refract the beam passing through the fourth portion out of the lens to the radiation receiver.
6 more elements
Dependencies are inferred from the claim text.