Process for the computer-assisted measurement and testing of electric circuits, especially electronic modules, and testing station for implementing the process

#1. Field of the Invention

#A method for computer-aided measurement and testing of electrical circuits using test software, and a test rig for carrying out such method, wherein the test software is split into a data-relevant element and a control-relevant element, the data-relevant element being formed in a text data field from which the control-relevant information can then be picked off.

#2. Description of the Prior Art

#FIG. 1 is a schematic view of an embodiment of a test rig of the present invention.

#FIG. 2 is a block diagram schematic of an embodiment of the method of the present invention.

#FIG. 3 is a diagrammatic representation of a text data field and, underneath it, a print-out of a listing of individual test steps for carrying out a test process according to a method of the present invention .

#The test rig illustrated in FIG. 1 contains a computer unit 1 having a controller 2, and a printer 3. Furthermore the test rig contains a test equipment peripheral 4 which, in the example in this case, is equipped with a digital multimeter as a single test set 5, with a potentiometer as an adjusting device 6, and with a power supply unit 7 for the power supply. The unit under test, in the example an electronic assembly 8, for power supply purposes, is inserted into a test adapter 9. Test adaptor 9 is provided with supply terminals 10 for the electrical power supply and supply terminals 11 for measurement and adjustment purposes and for the connection of the potentiometer 6 in the illustrated example. In addition, the test adapter 9 has a connecting device 12 for a control line 13 from the test set 5, in the example the digital multimeter. This test set 5 is connected to the computer unit 1 via a standardized databus 14.

#The basic structure illustrated in FIG. 2 for the method according to the present invention shows the splitting of the test software into a sequence-relevant element DA and a control-relevent element TR. The sequence-relevant element DA calls up the test specification data PS and the test instruction data PA in sequence from a text data field TD. The control-relevant element TR, containing the driver section which is independent of the respective electronic assemblies to be tested, is provided for the test equipment, as well as its test routines required for the measurements. The data-relevant element is formed in the text data field TD, from which the control-relevant information can be picked off by the test equipment drivers. Thus, the only remaining pure test software is the product-independent test equipment drivers and their test routines. The actual test sequence is provided from the sequence of the successive text steps in the text data field TD. The structure shows that the test software is designed to be product-independent. The output variables from the test specifications PS and from the test instructions PA are kept transparent. The driver software is used to control the test equipment available at the respective test rig and is independent of the test location used. It is written only once, for matching to the agreed text data field TD, and contains the test routines required for the measurements. The test software may be formulated in any desired programming language. At the end, the text data field TD contains a measurement data field for a test record PP.

#FIG. 3 shows an example of a text data field TD for a plurality of items of test equipment. The test specification data PS, with stimuli and characteristic values, are located on the left-hand side of the text data field TD. Test instruction data PA, including test step information and instructions, are arranged in the center of the text data field TD. A measurement data field, with record data PP, is located on the right-hand side. The test specification data PS on the left-hand side of the text data field TD shows the program sequence, or the test step sequence. TD, underneath the text data field TD illustrated in FIG. 3 is a listing LS of individual test steps in the text data field TD. This listing LS shows the transparent data field and can be printed out on the printer of the computer unit that is used.