Method of producing gallium nitride semiconductor light emitting device
AssigneeNEC Corporation
InventorsAkitaka Kimura, Chiaki Sasaoka
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AssigneeNEC Corporation
InventorsAkitaka Kimura, Chiaki Sasaoka
Estimating the term…
A magnesium-doped semiconductor layer expressed by general formula Al.sub.x Ga.sub.1-x N (where 0.ltoreq.x.ltoreq.1) is formed on a substrate. Thereafter, on the semiconductor layer, a plurality of semiconductor layers (including an activation layer) expressed by general formula In.sub.x Al.sub.y Ga.sub.1-x-y N (where 0.ltoreq.x.ltoreq.1, 0.ltoreq.y.ltoreq.1, 0.ltoreq.x+y.ltoreq.1) are formed. The crystalline characteristics of semiconductor layers including a light emitting layer of a gallium nitride semiconductor light emitting device having a magnesium-doped gallium nitride semiconductor layer are good. Thus, in the case that the light emitting device is a laser device, it can be expected that the oscillating threshold value of the laser device becomes low. In the case that the light emitting device is a light emitting diode, it can be expected that the light emitting efficiency of the light emitting diode becomes high.
A method of producing a gallium nitride semiconductor light emitting device, comprising:
Dependencies are inferred from the claim text.