Method of operation for shortening burn-in time
OwnerJowsoon Hsuinventor
Life of this patent
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Abstract
A method of operation for shortening burn-in time. An unconnected pin in an address decoder is utilized as a dedicated burn-in pin. Through controlling the number of don't care input pins in the address decoder, the number of word line addresses for a memory that can be checked simultaneously is determined. Because the method of operation in this invention does not require changing any of the existing equipment and tooling, vast quantities of testing time and hence production cost can be saved.
Claims13
A method of operation for shortening burn-in time that is particularly suitable for use in a memory chip, wherein the memory chip comprises an address decoder and a memory unit, the address decoder further including a dedicated burn-in pin, a first input pin and a second input pin, the memory unit further including a first word line address, a second word line address, a third word line address and a fourth word line address, the method of burn-in testing including checking the functional operation of the first word line address, the second word line address, the third word line address and the fourth word line address, the method of carrying out the burn-in testing comprising:
- applying a high potential to the dedicated burn-in pin, and then choosing either the first input pin and the second input pin as a don't care pin, the other input pin then receiving an input address;
- simultaneously checking the first word line address and the second word line address when the input address pin is set to a low potential;
- and
- simultaneously checking the third word line address and the fourth word line address when the input address pin is set to a high potential.
A method of operation for shortening burn-in time that is particularly suitable for use in a memory chip, wherein the memory chip comprises an address decoder and a memory unit, the address decoder further including a dedicated burn-in pin and a plurality of input pins, the memory unit further including a plurality of word line addresses, the method of burn-in testing including checking the functional operation of the word line addresses, the method of carrying out the burn-in testing comprising:
- applying a high potential to the dedicated burn-in pin, wherein if n of the input pins is chosen as don't care pins, then the remaining input pins are set to respective high or low potentials so that a total of 2.sup.n word line addresses can be simultaneously checked, where n is an integer greater than one.
Dependencies are inferred from the claim text.