Semiconductor memory device

A semiconductor memory device provided with a readout mode in which a plurality of word data are read out from a memory cell array as a group and are subjected to a time division operation to be continuously output, the device comprising:

• a redundant unit which replaces a bit data of a defective bit present in the respective word data with a replacement data on a basis of the word data during said readout mode, thereby reconfiguring the plurality of word data;
• said readout mode being a page-mode in which a plurality of word data corresponding to one page is read out from the memory cell array;
• and
• a plurality of redundant circuits included as the redundant unit and provided so as to respectively correspond to the plurality of word data, for compensating for the defective bit present in the respective word data, each of the redundant circuits including:
• a detection portion for storing page address information of the defective bit and detecting an access to a page on which the defective bit is present;
• a bit information storage portion for storing output bit position information of the defective bit and outputting the stored output bit position information based on a detection result of the detection portion;
• and
• a replacement data storage portion for storing a replacement data and outputting the stored replacement data based on the detection result of the detection portion;
• the bit data of the defective bit specified by the output bit position information being replaced with the replacement data during the page mode, thereby reconfiguring the plurality of word data.