Flash EPROM erase algorithm with wordline level retry
AssigneeMacronix International Co., Ltd.
InventorChun-Hsiung Hung
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AssigneeMacronix International Co., Ltd.
InventorChun-Hsiung Hung
Estimating the term…
Methods and systems for floating gate memory cell array erasure with wordline level retry are disclosed. A data storage device includes a memory array organized into a plurality of blocks of memory cells, each of the blocks including a plurality of wordlines of memory cells. An energizing circuit applies energizing voltages to the memory cells to read and program addressed cells, and to erase selected blocks of memory cells, or the whole memory array. An erase verify circuit separately verifies erasure of the individual wordlines that compose each block that is erased. The control logic can include a plurality of shared wordline erase flags which correspond to respective wordlines in each particular block as they are verified. If the wordline passes erase verify, then the wordline erase flag is reset. Only those wordlines having a set wordline erase flag after the erase verify operation are re-erased. To support this operation, the circuit includes the capability of erasing only a single wordline of the memory array at a time. The invention provides the advantages of higher speed of erasure and enhanced protection against over erasure.
A method of erasing a floating gate memory array that includes a plurality of blocks of floating gate memory cells, each of the plurality of blocks including a plurality of wordlines of floating gate memory cells, the method comprising:
An apparatus for storing data, comprising:
A FLASH EPROM integrated circuit, comprising:
An apparatus for storing data, comprising:
Dependencies are inferred from the claim text.