Insulation testing method and apparatus therefor
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsYasuo Iijima, Masahiro Tsubokawa
Life of this patent
Estimating the term…
Abstract
A voltage value of an impulse voltage repetitively applied on a test-piece coil is increased in accordance with time elapse. A terminal voltage applied on both ends of the test-piece coil is monitored to detect an electric breakdown of the test-piece coil. Upon detecting such a breakdown, application of the impulse voltage is immediately stopped to prevent the test-piece coil from being unnecessarily damaged. Meanwhile, a voltage value of the impulse voltage is measured quantitatively at the time the electric breakdown is detected and the measured data is stored in a memory, so that the memorized data can be used later as a breakdown voltage value.
Claims5
An insulation testing apparatus comprising:
- a DC-voltage power source for generating an output voltage whose value increases up to a predetermined voltage in accordance with elapsed time;
- on imputs voltage generating means for receiving said output voltage from said DC-voltage power source and generating a series of impulse voltage signals, wherein a voltage value of each successive impulse voltage signal in the series is increased;
- a failure detecting means for detecting any electric breakdown of a test-piece coil to which the series of impulse voltage signals is applied and generating a failure signal;
- and
- a means for deactivating said impulse voltage generating means in response to said failure signal and measuring a voltage value of an impulse voltage signal from the series of impulse voltage signals that was applied to the test-piece coil at the time said electric breakdown is detected.
An insulation testing method comprising steps of:
- applying a series of impulse voltage signals to a test-piece, wherein a voltage value of each successive impulse voltage signal in the series is increased;
- monitoring a terminal voltage of the test-piece as each of the impulse voltage signals is applied to the test-piece to detect an electric breakdown of said test-piece;
- and
- stopping application of the series of impulse voltages signals to the test-piece when an electric breakdown is detected.
An impulse testing method comprising the steps of:
- applying a series of impulse voltage signals to a test-piece through a capacitor that is repetitively charged and discharged to generate said series of impulse voltage signals, wherein a voltage value of each successive impulse voltage signal in the series is increased;
- monitoring a terminal voltage of the test-piece as each of the impulse voltage signals is applied to the test-piece to detect an electric breakdown of said test-piece;
- and
- stopping application of the series of impulse voltage signals to the test-piece when an electric breakdown is detected.
A testing apparatus comprising:
- a voltage generating means for generating an adjusted voltage;
- a capacitor charged by the adjusted voltage of said voltage generating means;
- a switching means for discharging said capacitor to give an impulse voltage signal to a test-piece;
- means for applying a series of impulse voltage signals to said test-piece by repetitively charging and discharging said capacitor, wherein a voltage value of each successive impulse voltage signal in the series is increased by controlling said adjusted voltage;
- failure detecting means for detecting any electric breakdown of said test-piece and generating a failure signal;
- and
- means for stopping application of said series of impulse voltage signals to said test-piece in response to said failure signal and measuring a voltage value of an impulse voltage signal from said series of impulse voltage signals that was applied to the test-piece at the time said electric breakdown is detected.
Dependencies are inferred from the claim text.