Method of testing a connection which includes a conductor in an integrated circuit
AssigneeU.S. Philips Corporation
InventorsFranciscus G. M. De Jong, Johannes De Wilde
Life of this patent
Estimating the term…
Abstract
An integrated circuit includes a sensor which is arranged in the vicinity of a conductor in the circuit and is capable of measuring the current through the conductor. This sensor, for example constructed as a coil, is capable of determining whether a connection which includes the conductor is in order. It can thus be tested notably whether the possibly multiple supply connection of the integrated circuit is appropriately connected to an external connection terminal.
Claims18
A method of testing a connection which includes a conductor in an integrated circuit, the conductor being coupled to an external connection terminal of the integrated circuit, which method includes the following steps:
- applying a stimulus to the integrated circuit in order to form a response in the conductor,
- detecting a response in the conductor in the integrated circuit,
- characterizing the functioning of the connection on the basis of the response,
- characterized in that the detecting of the response involves the measurement of current through the conductor by a sensor situated in the integrated circuit in the vicinity of the conductor.
An integrated circuit, comprising:
- a conductor for conducting a current;
- and
- a sensor arranged within the integrated circuit in the vicinity of the conductor in order to characterize the current.
Dependencies are inferred from the claim text.