Semiconductor device having contact check circuit
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorSusumu Tanida
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Abstract
A contact check circuit of a semiconductor device includes N-channel MOS transistors connected in series between pads located at opposing ends, with their gates respectively connected to intermediate pads. At the contact check, conduction between opposing pads is checked, applying an "H" level to probes corresponding to the pads. Thus contact between the pads and probes of a semiconductor testing apparatus can be checked at once.
Claims4
A semiconductor device having first to Nth pads (N is an integer equal to or larger than 3) for receiving external signals, and a contact check circuit for performing a contact check between first to Nth probes of a semiconductor testing apparatus and said first to Nth pads prior to a test, wherein
- said contact check circuit includes first to N-2th transistors connected in series between said first pad and said Nth pad and having respective input electrodes connected to said second to N-1th pads, and
- at said contact check, a test signal is applied to each one of said second to N-1th probes in order to render each one of said first to N-2th transistors conductive, and conduction between said first and Nth probes is checked.
Dependencies are inferred from the claim text.