Method of holding substrate and substrate holding system
AssigneeHitachi, Ltd.
InventorsNaoyuki Tamura, Kazue Takahashi, Youichi Ito, Yoshifumi Ogawa, Hiroyuki Shichida, Tsunehiko Tsubone
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AssigneeHitachi, Ltd.
InventorsNaoyuki Tamura, Kazue Takahashi, Youichi Ito, Yoshifumi Ogawa, Hiroyuki Shichida, Tsunehiko Tsubone
Estimating the term…
In a method of holding a substrate and a substrate holding system, the amount of foreign substances on the back surface of the substrate can be decreased and only a small amount of foreign substances transferred from a mounting table to the substrate. For this purpose, the substrate holding system has a ring-shaped leakage-proof surface providing a smooth support surface on the specimen table corresponding to the periphery of the substrate, a plurality of contact holding portions which bear against the substrate on the specimen table between the corresponding position to the periphery of the substrate and the corresponding position to the center of the substrate, and electrostatic attraction means for fixing the substrate by contacting the back surface of the substrate to the ring-shaped leakage-proof surface and the contact holding portions. The substrate is exosed to a cooling surface at the ring-shaped leakage-proof surface and the contact holding portion placed at a position inside the ring-shaped leakage-proof surface. The back surface of the substrate and the cooling surface do not contact each other in the large portion of the remaining area.
A method of holding a substrate, in a plasma treatment apparatus having a vacuum treating chamber, using a holding member having a temperature measuring member with a temperature control function for controlling the temperature of a substrate, the substrate being mounted on and fixed to said holding member having said temperature control function, and means for supplying a gas between said holding member and the back surface of said substrate from a gas supplying portion provided on the holding member, which method comprises the steps of:
A method of holding a substrate, in a treatment apparatus having a vacuum treating chamber, using a holding member having a temperature control function for controlling the temperature of a substrate, the substrate being mounted on and fixed to said holding member having said temperature control function, and means for supplying a gas between said holding member and the back surface of said substrate from a gas supplying portion provided on the holding member, which method comprises the steps of:
A method of holding a substrate, in a treatment apparatus having a vacuum treating chamber, using a holding member having a temperature control function for controlling the temperature of a substrate, the substrate being mounted on and fixed to said holding member having said temperature control function, and means for supplying a gas between said holding member and the back surface of said substrate from a gas supplying portion provided on the holding member, which method comprises the steps of:
Dependencies are inferred from the claim text.