Microprocessor and method of testing the same
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsAtsushi Kukutsu, Kozo Nuriya, Takao Ohkawara, Junji Soga, Tadashi Yoshino
Life of this patent
Estimating the term…
Loading patent…
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsAtsushi Kukutsu, Kozo Nuriya, Takao Ohkawara, Junji Soga, Tadashi Yoshino
Estimating the term…
A microprocessor includes an assign function for assigning ports to a mode identifying unit, test signal input unit, and test result signal output unit, a test implement function for sending test results to the test result signal output unit according to the test data signals input from the test signal input unit, and an activation control function for activating the test implement function upon identifying a test mode by the status of the mode identifying unit. When a test mode signal from test equipment is received at the test mode identifying unit assigned to one port of the microprocessor, the test signal input unit and the test result signal output unit are assigned to other ports of the microprocessor, and when the test data signals from the test equipment are received at the test data signal input unit, test result signals according the test data signals are output from the test result signal output unit.
A test method for testing electrical connections between a circuit board and ports of a microprocessor mounted on said circuit board, said method involving the use of test equipment which transfers signals to and from said microprocessor, said microprocessor including a storage means storing an assign function for assigning one port of said microprocessor to mode identifying means for identifying a test mode and other ports of said microprocessor to test signal input means and test signal output means, respectively, in accordance with inputoutput directions of said other ports of said microprocessor;
A test method for testing electrical connections between a circuit board and ports of a microprocessor mounted on said circuit board, said method involving the use of test equipment which transfers signals to and from said microprocessor, said microprocessor including a storage means storing an assign function for assigning one port of said microprocessor to mode identifying means for identifying a test mode and other ports of said microprocessor to test signal input means and test signal output means, respectively, in accordance with input/output directions of said other ports of said microprocessor;
A test method for testing electrical connections between a circuit board and ports of a microprocessor mounted on said circuit board, said method involving the use of test equipment which transfers signals to and from said microprocessor, said microprocessor being connected to an IEEE standard 1149.1 compliant device, said microprocessor including a storage means storing an assign function for assigning one port of said microprocessor to mode identifying means for identifying a test mode and other ports of said microprocessor to test signal input means and test signal output means, respectively, in accordance with input/output directions of said other ports of said microprocessor;
A test method for testing electrical connections between a circuit board and ports of a microprocessor mounted on said circuit board, said method involving the use of test equipment which transfers signals to and from said microprocessor, said microprocessor being connected to an IEEE standard 1149.1 compliant device, said microprocessor including a storage means storing an assign function for assigning one port of said microprocessor to mode identifying means for identifying a test mode and other ports of said microprocessor to test signal input means and test signal output means, respectively, in accordance with input/output directions of said other ports of said microprocessor;
A microprocessor including in a storage means thereof:
Dependencies are inferred from the claim text.