Coded aperture X-ray imaging system
AssigneeAmerican Science and Engineering, Inc.
InventorsSuzhou Huang, Michael V. Hynes
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AssigneeAmerican Science and Engineering, Inc.
InventorsSuzhou Huang, Michael V. Hynes
Estimating the term…
An X-ray imaging system which measures X-rays scattered by material concealed within an enveloping surface. A beam of X-ray radiation is incident on the enveloping surface and scattered onto one or more arrays of detectors. One or more masks of material opaque to X-ray transmission but for a series of apertures is interposed between the object and the detectors so as to cast shadows on different parts of the detector array. The image of the scattering material, as detected at the detector array, is modulated by the pattern of mask apertures. A controller reconstructs the image of the illuminated line. By scanning the illumination with respect to the object, an image of the entire object in scattered radiation is obtained, while use of multiple arrays or variation of geometrical settings allows reconstruction of the source of scattering in three dimensions.
An imaging system for analyzing material, comprising:
A method for analyzing concealed material within an enveloping surface, comprising:
A method for deriving a tomographic image of an object, the method comprising:
An imaging system for analyzing material, comprising:
Dependencies are inferred from the claim text.