Smart B-I-T (Built-In-Test)
AssigneeNorthrop Grumman Corporation
InventorsJohn Zbytniewski, Charles H. Cooper
Life of this patent
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Abstract
A smart built-in-test device for classifying fault behavior in electronic systems comprising a temporal monitor monitoring fault, classifying fault behavior and generating fault behavior data as the system operates in real time; one or more sensors for measuring environmental stress conditions in real-time and outputting environmental stress condition data. A fault correlator device for receiving the fault behavior data and the environmental stress condition data and correlating fault behavior to environmental stress conditions to determine if significant correlation exists.
Claims29
A smart built-in-test device for classifying fault behavior in electronic systems comprising:
- at least one sensor for measuring environmental stress conditions and generating environmental stress condition data;
- and,
- a temporal monitor for monitoring faults, classifying fault behavior according to a classification scheme including intermittent faults, and generating fault behavior data;
- a fault correlator for receiving said fault behavior data and said environmental stress condition data upon detection of an intermittent fault state, and employing statistical analysis to determine if a significant correlation exists between said fault behavior data and said environmental stress condition data.
Dependencies are inferred from the claim text.