Apparatus for identifying type of molten metal probe
AssigneeHeraeus Electro-Nite International N.V.
InventorsHarry G. Clauss, Jr., Jeffrey W. Corey
Life of this patent
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Abstract
A universal connector apparatus for probes used for measuring one or more parameters of molten material which identifies a probe type is provided. The probes each include a probe connector having a plurality of contacts arranged in a contact configuration. The universal connector is adapted to be connected to a drop mechanism, and includes a receptacle which is complementary to and adapted to receive a probe connector. A plurality of contacts are located in the receptacle and are positioned to provide electrical connections with the probe connector contacts. An identifying device is electrically connected to the contacts in the receptacle to detect short circuits between the contacts.
Claims4
A universal connector apparatus for probes used for measuring one or more parameters of molten material which identifies a probe type, each probe including a probe connector having a plurality of contacts arranged in a contact configuration, the universal connector being adapted to be connected to a drop mechanism, the universal connector apparatus comprising:
- a receptacle which is complementary to and adapted to receive a probe connector;
- a plurality of contacts located in the receptacle which are positioned to provide electrical connections with the probe connector contacts;
- and
- an identifying device electrically connected to the contacts in the receptacle to detect short circuits between the contacts.
A method of identifying a probe type in a drop mechanism for probes of the type used for measuring one or more parameters of molten material after the probe is connected to the drop mechanism, the drop mechanism including a plurality of universal connectors, the method comprising:
- placing at least one probe in the drop mechanism and inserting a probe connector from the at least one probe into a receptacle of one of the plurality of universal connectors located on the probe drop mechanism such that contacts on the probe connector are electrically connected to contacts in the universal connector;
- detecting short circuits between the contacts located in each of the plurality of universal connectors;
- and
- identifying the probe type of the probe in at least one of the universal connectors based on the short circuits detected.
Dependencies are inferred from the claim text.