Method for automatic diagnosis of malfunctions
AssigneeSiemens Aktiengesellschaft
InventorsPeter Schwarz, Ulrich Bungert, Rolf Kramer
Life of this patent
Estimating the term…
Abstract
In the case of processor or installations, or both, which are monitored by sequence control from a PLC program which is produced as a contact plan (KOP), as a function plan (FUP) or as an instruction list (AWL), the AWL code of the PLC program is analyzed by machine and is prepared in the form of a knowledge base, according to the invention, in order to prepare for diagnosis. Step chain analysis and/or a transition analysis are/is carried out in order to prepare the knowledge base.
Claims7
A method for automatic diagnosis of defects in at least one of processes and installations which are monitored by sequence control from a PLC program which is produced as a contact plan, as a function plan or as an instruction list, comprising the following steps:
- a) converting PLC programs which are a contact plan or a function plan into an instruction list,
- b) in order to prepare for diagnosis, analyzing AWL code of the PLC program by
- machine, including:
- carrying out a step chain analysis, including the substep of:
- identifying step chains executed in the program code in terms of memory operands used and in terms of their sequence and,
- in consequence, automatically locating step chains which are executed in the program code,
- c) forming a knowledge base of the step chains found in step b and deriving a topmost decision level of a fault tree from said knowledge base,
- d) determining a process feature which leads to a defect together with a diagnosis shell, from the fault tree produced in step b.
Dependencies are inferred from the claim text.